Nonlinear optical and optical limiting properties of In2S3 chalcogenide thin films: Influence of defect states and deposition technique

2026-05-01
Hilal, Omer
Emur, H. Gulce
Dogan, Anil
YILDIZ, ELİF
Isik, Mehmet
Parlak, Mehmet
Surucu, Ozge
ELMALI, AYHAN
KARATAY, AHMET
In this study, the nonlinear absorption (NA) and optical limiting (OL) properties of indium sulfide (In2S3) thin films prepared by physical vapor deposition (PVD) and radio-frequency (RF) magnetron sputtering were investigated. Linear optical analysis revealed distinct Urbach energies of 1.14 eV and 0.27 eV for the PVD-grown and RF-sputtered films, respectively, indicating higher defect density in the former. Photoluminescence (PL) measurements showed broader and stronger visible emission for the RF-sputtered film, while the PVD-grown film exhibited narrower near-band-edge emission. Femtosecond transient absorption spectroscopy further revealed that the PVD-grown film featured broad excited-state absorption and faster decay dynamics, whereas the RF-sputtered film displayed ground-state bleaching and longer lifetimes, consistent with fewer traps and reduced carrier loss. Open-aperture Z-scan analysis under 532 nm, 4 ns excitation indicated intensity-dependent NA dominated by defect-assisted processes. The effective nonlinear coefficients from the defect-saturation model were over an order of magnitude higher than those from the Sheik–Bahae model. The RF-sputtered film exhibited shallower defect states that enhanced sequential two-photon and free-carrier absorption, while the PVD-grown film showed early saturation due to localized-state filling. Optical limiting thresholds of 2.63 mJ/cm2 (RF) and 7.15 mJ/cm2 (PVD) confirm the superior limiting performance of the RF-sputtered In2S3 film for visible-range nonlinear photonic applications.
Journal of Luminescence
Citation Formats
O. Hilal et al., “Nonlinear optical and optical limiting properties of In2S3 chalcogenide thin films: Influence of defect states and deposition technique,” Journal of Luminescence, vol. 293, pp. 0–0, 2026, Accessed: 00, 2026. [Online]. Available: https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=105030053873&origin=inward.