Realization of detector based spectralresponsivity scale from ultraviolet to near infrared regions of electromagnetic spectrum

Bazkır, Özcan
Realization of spectral responsivity scale was studied in three stages. Firstly, absolute optical power measurements using Electrical Substitution Cryogenic Radiometer (ESCR) was studied. The absolute measurements were done at discrete laser wavelengths of tunable Ar+ (488 nm and 514.5 nm), Nd:YAG (532 nm) and fixed He-Ne (632.8 nm) laser sources. To increase measurement accuracy the method used for the stabilization of laser beams, transmittance measurements of optical windows, and minimization of scattered beams were discussed. Secondly, realization of absolute responsivity scale between 350- 850 nm ranges was studied. The scale based on reflection type trap detectors consisting of three silicon photodiodes. Various measurement systems were established in order to make optical characterization of trap detectors like non-linearity, surface non-homogeneity, polarization dependency, reflectance, and internal quantum efficiency. The absolute responsivity was linked to the absolute optical power by measuring the current response of trap detectors to the absolute power measured by ESCR system at laser wavelengths. Using models for the trap detector̕s, reflectance and internal quantum efficiency the scale between 350- 850 nm ranges was realized with an uncertainty of 0.05 %. Finally, the spectral responsivity scale in ultraviolet (UV) and near-infrared (NIR) regions was realized using Electrically Calibrated Pyroelectric Radiometer (ECPR). Optically characterizing the spatial non-uniformity of pyroelectric detector and its surface reflectance, the spectral responsivity scale was established with uncertainties ±0.5-1.0 % between 250 nm and 350 nm and ±0.5-1.5 % between 850 and 2500 nm.


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Citation Formats
Ö. Bazkır, “Realization of detector based spectralresponsivity scale from ultraviolet to near infrared regions of electromagnetic spectrum,” Ph.D. - Doctoral Program, Middle East Technical University, 2004.