Analyses of silicon based thin films by fourier transform infrared spectroscopy

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1999

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Bazkır, Özcan

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https://hdl.handle.net/11511/2458

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Graduate School of Natural and Applied Sciences, Thesis

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Citation Formats

Ö. Bazkır, “Analyses of silicon based thin films by fourier transform infrared spectroscopy,” Middle East Technical University, 1999.