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Electromigration- induced transgranular void motion in interconnects with special reference to computer simulations
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093086.pdf
Date
2000
Author
Ören, Ersin Emre
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https://hdl.handle.net/11511/2666
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Graduate School of Natural and Applied Sciences, Thesis
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E. E. Ören, “Electromigration- induced transgranular void motion in interconnects with special reference to computer simulations,” Middle East Technical University, 2000.