Noncontact lateral-force gradient measurement on Si(111)-7 x 7 surface with small-amplitude off-resonance atomic force microscopy

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Date

2009-03-01

Author

Atabak, Mehrdad
Unverdi, Ozhan
Özer, Hakkı Tunçay
Oral, Ahmet

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In this work, the authors report on a quantitative investigation of lateral-force gradient and lateral force between a tungsten tip and Si(111)-(7 x 7) surface using combined noncontact lateral-force microscopy and scanning tunneling microscopy. Simultaneous lateral-force gradient and scanning tunneling microscopy images of single and multiatomic step are obtained. In our measurement, tunnel current is used as feedback. The lateral-stiffness contrast has been observed to be 2.5 N/m at a single atomic step, in contrast to 13 N/m at a multiatomic step on Si (111) surface. They also carried out a series of lateral stiffness-distance spectroscopy, which show a sharp increase in tip-surface interaction stiffness as the sample is approached toward the surface. (C) 2009 American Vacuum Society. [DOL 10.1116/1.3097857]

Subject Keywords

Van-Der-Waals, Friction

URI

https://hdl.handle.net/11511/33072

Journal

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B

DOI

https://doi.org/10.1116/1.3097857

Collections

Department of Physics, Article

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Citation Formats

M. Atabak, O. Unverdi, H. T. Özer, and A. Oral, “Noncontact lateral-force gradient measurement on Si(111)-7 x 7 surface with small-amplitude off-resonance atomic force microscopy,” JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, pp. 1001–1005, 2009, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/33072.