XPS and in-situ IR investigation of Ru/SiO2 catalyst

Date

1997-06-16

Author

Sayan, S
Suzer, S
Üner, Deniz

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Ru(NO)(NO3)(3)/SiO2 catalyst precursors were characterized via XPS and in-situ reflectance IR spectroscopy before, during and after reduction by hydrogen over the temperature range 300-800 K. IR results indicated that the catalyst precursor lost NO3 groups first, with subsequent loss of NO both in a reducing atmosphere and during thermal annealing. XPS was used to derive information on the oxidation state of Ru in the various steps of the annealing and/or reduction processes. (C) 1997 Elsevier Science B.V.

Subject Keywords

Ru catalyst, XPS, In-situ IR

URI

https://hdl.handle.net/11511/35276

Journal

JOURNAL OF MOLECULAR STRUCTURE

DOI

https://doi.org/10.1016/s0022-2860(96)09637-8

Collections

Department of Chemical Engineering, Article

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Citation Formats

S. Sayan, S. Suzer, and D. Üner, “XPS and in-situ IR investigation of Ru/SiO2 catalyst,” JOURNAL OF MOLECULAR STRUCTURE, pp. 111–114, 1997, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/35276.