Show/Hide Menu
Hide/Show Apps
anonymousUser
Logout
Türkçe
Türkçe
Search
Search
Login
Login
OpenMETU
OpenMETU
About
About
Open Science Policy
Open Science Policy
Communities & Collections
Communities & Collections
Help
Help
Frequently Asked Questions
Frequently Asked Questions
Videos
Videos
Thesis submission
Thesis submission
Publication submission with DOI
Publication submission with DOI
Publication submission
Publication submission
Contact us
Contact us
XPS and in-situ IR investigation of Ru/SiO2 catalyst
Date
1997-06-16
Author
Sayan, S
Suzer, S
Üner, Deniz
Metadata
Show full item record
This work is licensed under a
Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
.
Item Usage Stats
3
views
0
downloads
Cite This
Ru(NO)(NO3)(3)/SiO2 catalyst precursors were characterized via XPS and in-situ reflectance IR spectroscopy before, during and after reduction by hydrogen over the temperature range 300-800 K. IR results indicated that the catalyst precursor lost NO3 groups first, with subsequent loss of NO both in a reducing atmosphere and during thermal annealing. XPS was used to derive information on the oxidation state of Ru in the various steps of the annealing and/or reduction processes. (C) 1997 Elsevier Science B.V.
Subject Keywords
Ru catalyst
,
XPS
,
In-situ IR
URI
https://hdl.handle.net/11511/35276
Journal
JOURNAL OF MOLECULAR STRUCTURE
DOI
https://doi.org/10.1016/s0022-2860(96)09637-8
Collections
Department of Chemical Engineering, Article
Citation Formats
IEEE
ACM
APA
CHICAGO
MLA
BibTeX
S. Sayan, S. Suzer, and D. Üner, “XPS and in-situ IR investigation of Ru/SiO2 catalyst,”
JOURNAL OF MOLECULAR STRUCTURE
, vol. 410, pp. 111–114, 1997, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/35276.