XPS and in-situ IR investigation of Ru/SiO2 catalyst

1997-06-16
Sayan, S
Suzer, S
Üner, Deniz
Ru(NO)(NO3)(3)/SiO2 catalyst precursors were characterized via XPS and in-situ reflectance IR spectroscopy before, during and after reduction by hydrogen over the temperature range 300-800 K. IR results indicated that the catalyst precursor lost NO3 groups first, with subsequent loss of NO both in a reducing atmosphere and during thermal annealing. XPS was used to derive information on the oxidation state of Ru in the various steps of the annealing and/or reduction processes. (C) 1997 Elsevier Science B.V.

Citation Formats
S. Sayan, S. Suzer, and D. Üner, “XPS and in-situ IR investigation of Ru/SiO2 catalyst,” JOURNAL OF MOLECULAR STRUCTURE, vol. 410, pp. 111–114, 1997, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/35276.