Surface morphology and depth profile study of Cd1-xZnxTe alloy nanostructures

Date

2012-12-25

Author

Yilmaz, Ercan
Tugay, Evrin
Aktag, Aliekber
Yıldız, İlker
Parlak, Mehmet
Turan, Raşit

Metadata

Show full item record

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Item Usage Stats

119
views

0
downloads

Cd1-xZnxTe thin films with thickness of 200 nm were deposited on glass substrates from a single sputtering target. During the deposition process, the substrates were heated at 400 degrees C and deposited films were subjected to an annealing process at 300 and 450 degrees C for an hour under flowing N-2 gas at atmospheric pressure. Influence of in situ heating and post-deposition annealing treatments on the structural and optical evolution of Cd1-xZnxTe nanostructures were investigated by diagnostic techniques such as X-ray diffraction (XRD), energy dispersive spectroscopy (EDS), scanning electron microscopy (SEM), atomic force microscopy (AFM). X-ray photoelectron spectroscopy (XPS), and UV-transmission spectroscopy. The transmission spectra in the region of the optical absorption band edge were measured for as-deposited and heat-treated of CdZnTe samples. Band gap of the deposited films were found to be in the range of 1.59-1.66 eV. The XRD studies revealed that heated Cd1-xZnxTe films have a cubic oriented (111), (220) and (311) polycrystalline structure whereas unheated films are mostly amorphous. The effects of annealing temperature on the composition of the thin films were discussed. XPS measurements were performed in the depth profiling mode in order to understand the variation in the chemical composition of the films. Results were compared with the structural analysis obtained from the XRD measurements.

Subject Keywords

CdZnTe, Sputtering, XRD, XPS, EDS, SEM, AFM

URI

https://hdl.handle.net/11511/37909

Journal

JOURNAL OF ALLOYS AND COMPOUNDS

DOI

https://doi.org/10.1016/j.jallcom.2012.08.028

Collections

Test and Measurement Center In advanced Technologies (MERKEZ LABORATUVARI), Article

Suggestions

OpenMETU
Core

Isochronal hydrogenation of textured magnesium/palladium thin films Özgit, Çağla; Öztürk, Tayfur; Department of Metallurgical and Materials Engineering (2009) Pure and palladium‐covered 350 nm thick magnesium thin films were deposited on glass substrates via thermal evaporation. In the as‐deposited state, films were highly textured with Mg (001) parallel to the substrate. Hydrogen loading experiments were carried out in two different conditions; namely isothermal and isochronal. Hydrogenation behaviors of the thin films were followed by twopoint probe electrical resistance and optical transmittance measurements, as well as x‐ray diffraction studies. Isothermal hy...
Isochronal hydrogenation of textured Mg/Pd thin films Ozgit, Cagla; Akyildiz, Hasan; Öztürk, Tayfur (2010-06-30) Magnesium thin films of 350 nm, capped with Pd, were deposited on glass substrates and hydrogenated in two different conditions; namely isochronal and isothermal. As-deposited films were highly textured with Mg (001) parallel to the glass substrate. Experiments have shown that under isothermal conditions starting from 333 K, Mg films can absorb hydrogen producing MgH(2) with a random texture. When the films were heated slowly starting from the room temperature, hydrogenation gives rise to a textured MgH2, w...
Fabrication and Characterization of Spin-coated TiO2 Films Hosseini, A.; Içli, K.Ç.; Özenbaş, M.; Erçelebi, Ayşe Çiğdem (Elsevier BV; 2014) Porous TiO2 films were deposited on glass and ITO coated glass substrates by spin coating for spinning rates of 2000, 5000, 2000 followed by successive run of 5000 rpm (2000-5000). The AFM, SEM, XRD and UV-Vis analysis of the films coated on bare glass substrates for individual and 2000-5000 rpm runs showed amorphous and crystalline behaviours respectively, while TiO2 films deposited on ITO/Glass substrates show crystalline structure. Both substrate nature and thickness of the films influence the formation ...
Material and device properties of Si-based Cu0.5Ag0.5InSe2 thin-film heterojunction diode Gullu, H. H.; Isik, M.; Delice, S.; Parlak, Mehmet; Hasanlı, Nızamı (Springer Science and Business Media LLC, 2020-01-01) Cu0.5Ag0.5InSe2 (CAIS) thin films were deposited on a glass substrate by sequential sputtering of Cu, Ag, and In2Se3-stacked film layers. Structural characterization showed that the deposited CAIS film satisfies nearly the stoichiometric form with uniform and homogeneous surface structure. The single-phase polycrystalline behavior without any secondary-phase formation was observed from the diffraction profile. The optical properties were investigated using temperature-dependent transmission measurements in ...
FABRICATION AND CHARACTERIZATION OF TiO2 THIN FILM FOR DEVICE APPLICATIONS HOSSEINI, AREZOO; GÜLLÜ, HASAN HÜSEYİN; COŞKUN, EMRE; Parlak, Mehmet; Erçelebi, Ayşe Çiğdem (2019-07-01) Titanium oxide (TiO2) film was deposited by rectification factor (RF) magnetron sputtering technique on glass substrates and p-Si (111) wafers to fabricate n-TiO2/p-Si heterojunction devices for the investigation of material and device properties, respectively. The structural, surface morphology, optical and electrical properties of TiO(2 )film were characterized by means of scanning electron microscopy (SEM), atomic force microscopy (AFM), X-ray diffraction (XRD), UV-visual (UV-Vis) spectral and dark curre...

Citation Formats

E. Yilmaz, E. Tugay, A. Aktag, İ. Yıldız, M. Parlak, and R. Turan, “Surface morphology and depth profile study of Cd1-xZnxTe alloy nanostructures,” JOURNAL OF ALLOYS AND COMPOUNDS, pp. 90–98, 2012, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/37909.