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Energy dissipation in atomic force microscopy and atomic loss processes
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Date
2001-12-24
Author
HOFFMANN, PETER M
JEFFERY, STEVE
PETHİCA, JOHN B
ÖZER, HAKAN ÖZGÜR
Oral, Ahmet
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Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
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Atomic scale dissipation is of great interest in nanomechanics and atomic manipulation. We present dissipation measurements with a linearized, ultrasmall amplitude atomic force microscope which is capable of measuring dissipation at chosen, fixed separations. We show that the dynamic dissipation in the noncontact regime is of the order of a few 10-100 meV per cycle. This dissipation is likely due to the motion of a bistable atomic defect in the tip-surface region. In the contact regime we observe dc hysteresis associated with nanoscale plasticity. We find the hysteretic energy loss to be 1 order of magnitude higher for a silicon surface than for copper.
Subject Keywords
Fluctuating electromagnetic-fields
,
Brownian-motion
,
Solids
URI
https://hdl.handle.net/11511/41805
Journal
PHYSICAL REVIEW LETTERS
DOI
https://doi.org/10.1103/physrevlett.87.265502
Collections
Department of Physics, Article