Energy dissipation in atomic force microscopy and atomic loss processes

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2001-12-24
HOFFMANN, PETER M
JEFFERY, STEVE
PETHİCA, JOHN B
ÖZER, HAKAN ÖZGÜR
Oral, Ahmet
Atomic scale dissipation is of great interest in nanomechanics and atomic manipulation. We present dissipation measurements with a linearized, ultrasmall amplitude atomic force microscope which is capable of measuring dissipation at chosen, fixed separations. We show that the dynamic dissipation in the noncontact regime is of the order of a few 10-100 meV per cycle. This dissipation is likely due to the motion of a bistable atomic defect in the tip-surface region. In the contact regime we observe dc hysteresis associated with nanoscale plasticity. We find the hysteretic energy loss to be 1 order of magnitude higher for a silicon surface than for copper.