Energy dissipation in atomic force microscopy and atomic loss processes

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Date

2001-12-24

Author

HOFFMANN, PETER M
JEFFERY, STEVE
PETHİCA, JOHN B
ÖZER, HAKAN ÖZGÜR
Oral, Ahmet

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Atomic scale dissipation is of great interest in nanomechanics and atomic manipulation. We present dissipation measurements with a linearized, ultrasmall amplitude atomic force microscope which is capable of measuring dissipation at chosen, fixed separations. We show that the dynamic dissipation in the noncontact regime is of the order of a few 10-100 meV per cycle. This dissipation is likely due to the motion of a bistable atomic defect in the tip-surface region. In the contact regime we observe dc hysteresis associated with nanoscale plasticity. We find the hysteretic energy loss to be 1 order of magnitude higher for a silicon surface than for copper.

Subject Keywords

Fluctuating electromagnetic-fields, Brownian-motion, Solids

URI

https://hdl.handle.net/11511/41805

Journal

PHYSICAL REVIEW LETTERS

DOI

https://doi.org/10.1103/physrevlett.87.265502

Collections

Department of Physics, Article

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Citation Formats

P. M. HOFFMANN, S. JEFFERY, J. B. PETHİCA, H. Ö. ÖZER, and A. Oral, “Energy dissipation in atomic force microscopy and atomic loss processes,” PHYSICAL REVIEW LETTERS, pp. 0–0, 2001, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/41805.