Measurement of energy dissipation between tungsten tip and Si(1 0 0)-( 2 × 1 ) using sub-Ångström oscillation amplitude non-contact atomic force microscope

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Date

2003-03-31

Author

Özer, H. Özgür
Atabak, Mehrdad
Oral, Ahmet

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Energy dissipation plays an important role in non-contact atomic force microscopy (nc-AFM), atomic manipulation and friction. In this work, we studied atomic scale energy dissipation between a tungsten tip and Si(1 0 0)-(2×1) surface. Dissipation measurements are performed with a high sensitivity nc-AFM using sub-Ångström oscillation amplitudes below resonance. We observed an increase in the dissipation as the tip is approached closer to the surface, followed by an unexpected decrease as we pass the inflection point in the energy–distance curve. This dissipation is most probably due to transformation of the kinetic energy of the tip into phonons and heat.

Subject Keywords

Surfaces, Coatings and Films

URI

https://hdl.handle.net/11511/42051

Journal

Applied Surface Science

DOI

https://doi.org/10.1016/s0169-4332(02)01472-1

Collections

Department of Physics, Article

Citation Formats

H. Ö. Özer, M. Atabak, and A. Oral, “Measurement of energy dissipation between tungsten tip and Si(1 0 0)-( 2 × 1 ) using sub-Ångström oscillation amplitude non-contact atomic force microscope,” Applied Surface Science, vol. 210, pp. 12–17, 2003, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/42051.