Development of SAMPLE Scanning High Speed AFM operating at 1,000 Lines/s 15µm x 15µm x 3µm

Date

2017-05-19

Author

Çelik, Ümit
Uysallı, Yiğit
Kehribar, İhsan
Çelik, Kübra
Özer, Hakan Özgür
Oral, Ahmet

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URI

https://hdl.handle.net/11511/71270

Conference Name

The 19th InternationalScanning Probe Microscopy Conference (2017)

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Unverified, Conference / Seminar

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Citation Formats

Ü. Çelik, Y. Uysallı, İ. Kehribar, K. Çelik, H. Ö. Özer, and A. Oral, “Development of SAMPLE Scanning High Speed AFM operating at 1,000 Lines/s 15µm x 15µm x 3µm,” presented at the The 19th InternationalScanning Probe Microscopy Conference (2017), Kyoto, Japonya, 2017, Accessed: 00, 2021. [Online]. Available: https://hdl.handle.net/11511/71270.