Tin coating thickness measurement by energy dispersion x-ray fluorescence method using semiconductor detector and radioisotopic excitation.

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1977

Author

Güneş., C Halit

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https://hdl.handle.net/11511/7668

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Graduate School of Natural and Applied Sciences, Thesis

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Citation Formats

C. H. Güneş., “Tin coating thickness measurement by energy dispersion x-ray fluorescence method using semiconductor detector and radioisotopic excitation.,” Middle East Technical University, 1977.