Band alignment measurements of ZnOx/Si , MoOX/Si interfaces by ultraviolet photoelectron spectroscopy for heterojunction silicon

Date

2017-09-21

Author

Yıldız, İlker
Bektaş, Gence
Turan, Raşit
Yerci, Selçuk

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https://hdl.handle.net/11511/80593

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Citation Formats

İ. Yıldız, G. Bektaş, R. Turan, and S. Yerci, “Band alignment measurements of ZnOx/Si , MoOX/Si interfaces by ultraviolet photoelectron spectroscopy for heterojunction silicon,” 2017, Accessed: 00, 2021. [Online]. Available: https://hdl.handle.net/11511/80593.