Development of tip Scanning High Speed AFM operating at 1 000 Lines s 15um

Date

2016-03-18

Author

Çelik, Umıt
Kehribar, Ihsan
Oral, Ahmet

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High speed atomic force microscope allows imaging dynamic processes on the surfaces. We have developed a very high speed tip scanning atomic force microscope (HS-AFM). We designed the tip scanning system to overcome the sample size limits, with a beam tracking capability to follow the cantilever motion. A high resonance frequency flexure scanner developed which has 15m scan range in XY and 3m in Z axis. A novel FPGA based high speed scanning and data acquisition system was developed. The scanner is driven by sine wave in X-axis to avoid resonances and data were captured at equal sample intervals. 1 KHz line scan rate is achieved at 15m scan range with the HS-AFM.

URI

https://hdl.handle.net/11511/85602

Conference Name

American Physical Society, APS, March Meeting 2016, ( 14 - 18 Mart 2016)

Collections

Department of Physics, Conference / Seminar

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Citation Formats

U. Çelik, I. Kehribar, and A. Oral, “Development of tip Scanning High Speed AFM operating at 1 000 Lines s 15um,” presented at the American Physical Society, APS, March Meeting 2016, ( 14 - 18 Mart 2016), Baltimore, ABD, 2016, Accessed: 00, 2021. [Online]. Available: https://hdl.handle.net/11511/85602.