Structural Investigation on Bulk Glass forming Zr55Al10Ni5Cu30 Alloy



Structural characterization of magnesium-nickel-X hydrogen storage alloys
Akşit, Eray; Akdeniz, Mahmut Vedat; Mekhrabov, Amdulla O.; Department of Metallurgical and Materials Engineering (2003)
Structural characterization of iron-based bulk metallic glass alloys produced by centrifugal casting
PEHLIVANOGLU, MK; Akdeniz, Mahmut Vedat; BOR, A Sakir (2003-05-01)
In this study bulk metallic glass alloys in the Fe-Zr-B-M (M=Al, Co, Cu, Mo, Ni, W) systemwere produced by using a centrifugal casting method. The thickness ofthe samples that could be produced with an almost completely amorphousstructure was found to be as high as similar to2 mm for alloy Fe60Co8Zr10Mo5W2B15. Alloying element additions or replacements have resulted in a considerable effect on glass-forming ability. Among others, Al and Cu were found to have the most deteriorative effects. The ternary alloy...
Structural investigation of monolayers prepared by deposition of (CH3S)(2) on the (111) face of single-crystal gold
Danışman, Mehmet Fatih; Bracco, G; Scoles, G (2002-11-14)
Although self-assembled monolayers made of long chains of n-alkanethiols [CH3(CH2)(n-1)SH] on Au(111) have been extensively studied in the past, the driving forces behind the appearance of the (3 x 2root3) superlattice observed at full coverage are still not completely understood. To focus on the role played by the sulfur headgroup minimizing the interactions between chains and to prevent a possible X-ray-induced damage, we have carried out a He atom diffraction study of the adsorption of the shortest (n = ...
Structural investigation of conducting polymer grafts of pyrrole via mass spectrometry
Uyar, Tamer; Toppare, Levent; Hacaloğlu, Jale; Department of Chemistry (2000)
Structural characterization of intrinsic a-Si:H thin films for silicon heterojunction solar cells
Pehlivan, O.; Yilmaz, O.; Kodolbas, A. O.; Duygulu, O.; Tomak, Mehmet (2013-01-01)
We have utilized ex-situ spectroscopic ellipsometry and HRTEM to characterize the optical and structural properties of intrinsic a-Si:H thin layer that plays a key role for the improvement of the open circuit voltage in silicon heterojunction solar cells. Intrinsic a-Si:H films were deposited on (100) p-type CZ silicon wafers by using Plasma Enhanced Chemical Vapor Deposition (PECVD) technique at 225 degrees C substrate temperature and deposition time ranges from 15 s to 1800 s. Observed changes in the imag...
Citation Formats
M. Türkeş, M. V. Akdeniz, and A. Mehrabov, “Structural Investigation on Bulk Glass forming Zr55Al10Ni5Cu30 Alloy,” 2000, vol. 3, Accessed: 00, 2021. [Online]. Available: