A CMOS compatible uncooled infrared detector focal plane array for night vision applications using mems technology

A 64x64 CMOS integrated readout circuit for infrared photodetector focal plane arrays Tepeöz, Murat; Akın, Tayfun; Department of Electrical and Electronics Engineering (2003)
A Fisheries model for the Mersin bay fisheries ecosystem. Gücü, Ali Cemal; Bingel, Ferit; Department of Marine Sciences (1991)
A low-cost small pixel uncooled infrared detector for large focal plane arrays using a standard CMOS process Eminoglu, S; Tanrikulu, MY; Tezcan, DS; Akın, Tayfun (2002-04-03) This paper reports the development of a low-cost, small pixel uncooled infrared detector using a standard CMOS process. The detector is based on a suspended and thermally isolated p(+)-active/n-well diode whose forward voltage changes due to an increase in the pixel temperature with absorbed infrared radiation. The detector is obtained with simple post-CMOS etching steps on dies fabricated using a standard n-well CMOS process. The post-CMOS process steps are achieved without needing any deposition or lithog...
A Small format microbolometer imaging sensor with digital video outputs Yalçın, Cem; Koç, Seyit Sencer; Department of Electrical and Electronics Engineering (2016) This thesis presents a small format Readout Integrated Circuit (ROIC) for surface micromachined resistive microbolometer imaging sensors. The imaging sensor is designed to work in the Long Wave Infrared region (8 – 14 um) and is designed with an 80 x80 format with a pixel pitch of 25 um. The ROIC is optimized to perform the readout of MEMS pixels with resistance values around 60 Kohm, where infrared blind reference resistors with similar values are also used to cancel effects of selfheating and high biasi...
Identification and characterization of traps in ingaas short wavelength infrared photodetectors by deep level transient spectroscopy Avishan, Nardin; Beşikci, Cengiz; Department of Electrical and Electronics Engineering (2016) Unintentionally added impurities during the epitaxial growth and lattice defects may cause deep level traps in the bandgap of semiconductors. They can strongly affect the electrical and optical properties of semiconductors. Studying these energy levels and providing feedback to the material growth and device fabrication processes are important in order to identify the performance limiting mechanisms and optimize the characteristics of semiconductor devices. Deep Level Transient Spectroscopy (DLTS) technique...

Citation Formats

D. S. Tezcan, “A CMOS compatible uncooled infrared detector focal plane array for night vision applications using mems technology,” Ph.D. - Doctoral Program, Middle East Technical University, 2002.