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Test Selection for Deep Neural Networks using Meta-Models with Uncertainty Metrics
Date
2024-09-16
Author
Demir, Demet
Betin Can, Aysu
Sürer, Elif
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This work is licensed under a
Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
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URI
https://hdl.handle.net/11511/110282
Conference Name
The 33rd edition of the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA)
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Graduate School of Informatics, Conference / Seminar
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D. Demir, A. Betin Can, and E. Sürer, “Test Selection for Deep Neural Networks using Meta-Models with Uncertainty Metrics,” presented at the The 33rd edition of the ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA), Vienna, Avusturya, 2024, Accessed: 00, 2024. [Online]. Available: https://hdl.handle.net/11511/110282.
