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Exploring Temperature-Dependent bandgap and Urbach energies in CdTe thin films for optoelectronic applications
Date
2024-10-15
Author
Surucu, O.
SÜRÜCÜ, GÖKHAN
Hasanlı, Nızamı
Parlak, Mehmet
Isik, M.
Metadata
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This study examines CdTe thin films deposited via RF magnetron sputtering, focusing on structural and optical properties. X-ray diffraction, Raman spectroscopy, and SEM assessed structural characteristics. Optical properties were analyzed through transmittance measurements from 10 to 300 K. Tauc plots and Varshni modeling revealed a temperature-dependent bandgap, increasing from 1.49 eV at room temperature to 1.57 eV at 10 K. Urbach energy rose from 82.7 to 93.7 meV with temperature. These results are essential for applications where temperature affects CdTe-based device performance.
Subject Keywords
Optical materials and properties
,
Solar energy materials
,
Sputtering
,
Thin Films
URI
https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85200135458&origin=inward
https://hdl.handle.net/11511/110766
Journal
Materials Letters
DOI
https://doi.org/10.1016/j.matlet.2024.137078
Collections
Department of Physics, Article
Citation Formats
IEEE
ACM
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MLA
BibTeX
O. Surucu, G. SÜRÜCÜ, N. Hasanlı, M. Parlak, and M. Isik, “Exploring Temperature-Dependent bandgap and Urbach energies in CdTe thin films for optoelectronic applications,”
Materials Letters
, vol. 373, pp. 0–0, 2024, Accessed: 00, 2024. [Online]. Available: https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=85200135458&origin=inward.