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Single Event Upset Tolerant TRNG Design and Its Tests Under Radiation
Date
2024-11-13
Author
Yılmaz, Özgür Ozan
Demirköz, Melahat Bilge
YALÇIN, MÜŞTAK ERHAN
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Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
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URI
https://doi.org/10.1109/dcis62603.2024.10769157
https://hdl.handle.net/11511/113187
DOI
https://doi.org/10.1109/dcis62603.2024.10769157
Conference Name
The 39th Conference on Design of Circuits and Integrated Systems (DCIS 2024)
Collections
Department of Physics, Conference / Seminar
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BibTeX
Ö. O. Yılmaz, M. B. Demirköz, and M. E. YALÇIN, “Single Event Upset Tolerant TRNG Design and Its Tests Under Radiation,” presented at the The 39th Conference on Design of Circuits and Integrated Systems (DCIS 2024), Catania, İtalya, 2024, Accessed: 00, 2025. [Online]. Available: https://doi.org/10.1109/dcis62603.2024.10769157.
