Differentiation of domains in composite surface structures by charge-contrast X-ray photoelectron spectroscopy

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2007-01-01

Author

Suzer, Sefik
Dana, Aykutlu
Ertaş, Gülay

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An external bias is applied to two samples containing composite surface structures, while recording an XPS spectrum. Altering the polarity of the bias affects the extent of differential charging in domains that are chemically or electronically different to create a charge contrast. By utilizing this charge contrast, we show that two distinct silicon nitride and silicon oxynitride domains are present in one of the composite samples. Similarly, we use this technique to show that titanium oxide and silicon oxide domains exist as separate chemical entities in another composite sample.

Subject Keywords

Analytical Chemistry

URI

https://hdl.handle.net/11511/45808

Journal

ANALYTICAL CHEMISTRY

DOI

https://doi.org/10.1021/ac0613683

Collections

Department of Chemistry, Article

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Citation Formats

S. Suzer, A. Dana, and G. Ertaş, “Differentiation of domains in composite surface structures by charge-contrast X-ray photoelectron spectroscopy,” ANALYTICAL CHEMISTRY, pp. 183–186, 2007, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/45808.