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Radiation pressure excitation of Low Temperature Atomic Force Magnetic Force Microscope LT AFM MFM in 4 300K Temperature Range
Date
2015-10-01
Author
Karcı, Özgür
Çelik, Ümit
Uysallı, Yiğit
Özer, Hakan Özgür
Oral, Ahmet
Metadata
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URI
https://hdl.handle.net/11511/73427
Conference Name
16th European Conference on Applications of Surface and Interface Analysis, ECASIA'15
Collections
Department of Physics, Conference / Seminar
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Radiation pressure excitation of low temperature atomic force magnetic force microscope LT AFM MFM for imaging
Karcı, Özgür; Çelik, Ümit; Uysallı, Yiğit; Özer, Hakan Özgür; Oral, Ahmet (2015-08-28)
Radiation pressure excitation of a low temperature atomic force/magnetic force microscope for imaging in 4-300 K temperature range
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We describe a novel radiation pressure based cantilever excitation method for imaging in dynamic mode atomic force microscopy (AFM) for the first time. Piezo-excitation is the most common method for cantilever excitation, however it may cause spurious resonance peaks. Therefore, the direct excitation of the cantilever plays a crucial role in AFM imaging. A fiber optic interferometer with a 1310 nm laser was used both for the excitation of the cantilever at the resonance and the deflection measurement of the...
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Ö. Karcı, Ü. Çelik, Y. Uysallı, H. Ö. Özer, and A. Oral, “Radiation pressure excitation of Low Temperature Atomic Force Magnetic Force Microscope LT AFM MFM in 4 300K Temperature Range,” presented at the 16th European Conference on Applications of Surface and Interface Analysis, ECASIA′15, Granada, Spain, 2015, Accessed: 00, 2021. [Online]. Available: https://hdl.handle.net/11511/73427.