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Deep Metric Learning with Chance Constraints
Date
2024-01-08
Author
GÜRBÜZ, YETİ ZİYA
Alatan, Abdullah Aydın
CAN, OĞUL
Metadata
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This work is licensed under a
Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
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URI
https://ieeexplore.ieee.org/document/10484253
https://hdl.handle.net/11511/111712
DOI
https://doi.org/10.1109/wacv57701.2024.00060
Conference Name
Winter Conference on Applications of Computer Vision
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Department of Electrical and Electronics Engineering, Conference / Seminar
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BibTeX
Y. Z. GÜRBÜZ, A. A. Alatan, and O. CAN, “Deep Metric Learning with Chance Constraints,” presented at the Winter Conference on Applications of Computer Vision, Waikoloa, Hawaii, Amerika Birleşik Devletleri, 2024, Accessed: 00, 2024. [Online]. Available: https://ieeexplore.ieee.org/document/10484253.
