Structural, electrical and optical characterization of ge-implanted gase single crystal grown by Bridgman Method

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2005
Karaağaç, Hazbullah
In this work, structural, electrical and optical characterization of as-grown, Ge-implanted, and annealed GaSe single crystals grown by using 3-zone vertical Bridgman-Stockbarger system, have been studied by carrying out X-ray Diffraction (XRD), electrical conductivity, Hall effect, photoconductivity, and spectral transmission measurements. The temperature dependent electrical conductivity of these samples have been measured between 100 and 400 K. As a result, it was observed that upon implanting GaSe with germanium following annealing process, the resistivity is reduced from 2.1x109 to 6.5x105 ?-cm. Also it was found that Ge-implantation followed by annealing at 500 oC increases the conductivity in exponential fashion. From the temperature dependent conductivities, the activation energies have been found to be 4, 34 and 314 meV for as-grown, 36 and 472 meV for as-implanted, and 39 and 647 meV for implanted and annealed at 500 oC GaSe single crystals. Using XRD measurements it was observed that there is an increase in peak intensities at specific annealing temperatures (300 and 500 C) and a decrease in higher annealing temperatures (700 C). Temperature dependent carrier concentration and Hall mobility measurement were performed in the temperature range of 230 - 410 and 100 - 400 K for as-grown and Ge-implanted and annealed GaSe samples, respectively. All of the samples in this study were found to be p-type with the help Hall measurements. In addition, the density of donor and acceptor atoms are found for each sample and results are compared with each other. In addition, using photoconductivity measurement the relation between photocurrent and illumination intensity and the character of photoconduction were determined. As a result it was found that while at specific temperature intervals impurity scatterings are dominant, in other intervals phonon scatterings start to

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Citation Formats
H. Karaağaç, “Structural, electrical and optical characterization of ge-implanted gase single crystal grown by Bridgman Method,” M.S. - Master of Science, Middle East Technical University, 2005.