In situ creep measurements on micropillar samples during heavy ion irradiation

2014-08-01
Özerinç, Sezer
King, William P.
We report on the development of an in situ micropillar compression apparatus capable of measuring creep under heavy ion beam irradiation. The apparatus has a force resolution of 1 mu N and a displacement resolution of 1 nm. The experimental setup consists of a nanopositioner, a laser displacement sensor, and a microfabricated doubly clamped silicon-beam transducer. The system was tested by measuring the creep rate of amorphous Cu56Ti38Ag6 micropillars as a function of applied stress during room temperature irradiation with 2.1 MeV Ne+. Measured values of the irradiation induced fluidity are in the range 0.5-3 dpa(-1) GPa(-1), and in good agreement with values obtained by stress relaxation experiments on other metallic glasses, and with predictions of molecular dynamics simulations. The in situ apparatus provides a practical approach for accelerated evaluation of irradiation induced creep in promising nuclear materials.
JOURNAL OF NUCLEAR MATERIALS

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Citation Formats
S. Özerinç and W. P. King, “In situ creep measurements on micropillar samples during heavy ion irradiation,” JOURNAL OF NUCLEAR MATERIALS, pp. 104–110, 2014, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/41162.