Complete test generation method for all stuck-at faults in combinational circuits

Date

1990-5

Author

GURAN, HASAN
HALICI, UGUR

Metadata

Show full item record

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Item Usage Stats

120
views

0
downloads

In combinational logic circuits the generation of complete fault detection test sets requires the determination of the complete test sets of all possible stuck-at faults. In this study, an efficient procedure is developed for finding all the complete test sets of all possible single stuck-at faults in a combinational circuit. The developed procedure primarily uses the properties of logic gates. An example is solved by the use of the developed procedure.

Subject Keywords

Electrical and Electronic Engineering

URI

https://hdl.handle.net/11511/51367

Journal

International Journal of Electronics

DOI

https://doi.org/10.1080/00207219008921209

Collections

Department of Electrical and Electronics Engineering, Article

Suggestions

OpenMETU
Core

Efficient parallelization of the multilevel fast multipole algorithm for the solution of large-scale scattering problems Ergül, Özgür Salih (Institute of Electrical and Electronics Engineers (IEEE), 2008-08-01) We present fast and accurate solutions of large-scale scattering problems involving three-dimensional closed conductors with arbitrary shapes using the multilevel fast multipole algorithm (MLFMA). With an efficient parallelization of MLFMA, scattering problems that are discretized with tens of millions of unknowns are easily solved on a cluster of computers. We extensively investigate the parallelization of MLFMA, identify the bottlenecks, and provide remedial procedures to improve the efficiency of the imp...
Discussion on stuck-at faults in combinational circuits Halıcı, Uğur (Informa UK Limited, 1989-7) In combinational logic circuits, stuck-at faults are permanent faults that are modelled as logical problems. In this study, a new method for finding the complete test set of single stuck-at faults is presented. A novel algorithm based on the given discussion is developed and applied to an example.
Efficient solution of the electric-field integral equation using the iterative LSQR algorithm Ergül, Özgür Salih (Institute of Electrical and Electronics Engineers (IEEE), 2008-01-01) In this letter, we consider iterative solutions of the three-dimensional electromagnetic scattering problems formulated by surface integral equations. We show that solutions of the electric-field integral equation (EFIE) can be improved by employing an iterative least-squares QR (LSQR) algorithm. Compared to many other Krylov subspace methods, LSQR provides faster convergence and it becomes an alternative choice to the time-efficient no-restart generalized minimal residual (GMRES) algorithm that requires la...
Clarification of issues on the closed-form Green's functions in stratified media Aksun, MI; Dural Ünver, Mevlüde Gülbin (Institute of Electrical and Electronics Engineers (IEEE), 2005-11-01) The closed-form Green's functions (CFGF), derived for the vector and scalar potentials in planar multilayer media, have been revisited to clarify some issues and misunderstandings on the derivation of these Green's functions. In addition, the range of validity of these Green's functions is assessed with and without explicit evaluation of the surface wave contributions. As it is well-known, the derivation of the CFGF begins with the approximation of the spectral-domain Green's functions by complex exponentia...
Fast and accurate solutions of extremely large integral-equation problems discretised with tens of millions of unknowns Gurel, L.; Ergül, Özgür Salih (Institution of Engineering and Technology (IET), 2007-04-26) The solution of extremely large scattering problems that are formulated by integral equations and discretised with tens of millions of unknowns is reported. Accurate and efficient solutions are performed by employing a parallel implementation of the multilevel fast multipole algorithm. The effectiveness of the implementation is demonstrated on a sphere problem containing more than 33 million unknowns, which is the largest integral-equation problem ever solved to our knowledge.

Citation Formats

H. GURAN and U. HALICI, “Complete test generation method for all stuck-at faults in combinational circuits,” International Journal of Electronics, pp. 657–666, 1990, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/51367.