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Characterization of Metamaterials using a New Design and Measurement Technique for Microstrip Circuit Applications
Date
2014-12-14
Author
Nesimoglu, Tayfun
Sabah, Cumali
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Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
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Characterization of a metamaterial based on an S-Shaped resonator and a feeding transmission line using a new measurement technique is studied in this paper. First, the metamaterial is designed and simulated using conventional methods. Then, it is fabricated on microstrip and excited by using a microstrip transmission feedline. Measurements were carried out using a vector network analyzer by (SubMiniature version A) SMA coaxial terminations without needing any waveguide transmission lines. For both simulated and measured results, the effective constitutive parameters are retrieved and analyzed. Results show the practicality and feasibility of the proposed measurement method in the characterization of metamaterials for microstrip based microwave circuit applications.
Subject Keywords
Metamaterial
,
Negative refraction
,
PCB applications
,
Using microstrip transmission line based method;
URI
https://hdl.handle.net/11511/65916
Collections
Engineering, Conference / Seminar
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T. Nesimoglu and C. Sabah, “Characterization of Metamaterials using a New Design and Measurement Technique for Microstrip Circuit Applications,” 2014, p. 57, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/65916.