Characterization of depleted in-device passivation layer for InGaAs photodetectors

Date

2018-06-21

Author

Çırçır, Kübra
Kocaman, Serdar

Metadata

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URI

http://www.qsip2018.com/abstracts/
https://hdl.handle.net/11511/87106

Conference Name

QSIP 2018, 16 - 21 June 2018

Collections

Department of Electrical and Electronics Engineering, Conference / Seminar

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Citation Formats

K. Çırçır and S. Kocaman, “Characterization of depleted in-device passivation layer for InGaAs photodetectors,” presented at the QSIP 2018, 16 - 21 June 2018, Stockholm, Sweden, 2018, Accessed: 00, 2021. [Online]. Available: http://www.qsip2018.com/abstracts/.