Linear measurements of nanomechanical phenomena using small-amplitude AFM

Date

2004-01-01

Author

Hoffmann, Peter M.
Patil, Shivprasad
Matei, George
Tanulku, Atay
Grimble, Ralph
Özer, Hakan Özgür
Jeffery, Steve
Oral, Ahmet
Pethica, John

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Dynamic Atomic Force Microscopy (AFM) is typically performed at amplitudes that are quite large compared to the measured interaction range. This complicates the data interpretation as measurements become highly non-linear. A new dynamic AFM technique in which ultra-small amplitudes are used (as low as 0.15 Angstrom) is able to linearize measurements of nanomechanical phenomena in ultra-high vacuum (UHV) and in liquids. Using this new technique we have measured single atom bonding, atomic-scale dissipation and molecular ordering in liquid layers, including water. © 2005 Materials Research Society.

URI

https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=34249872470&origin=inward
https://hdl.handle.net/11511/94439

DOI

https://doi.org/10.1557/proc-838-o1.8

Conference Name

2004 MRS Fall Meeting

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Department of Physics, Conference / Seminar

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Citation Formats

P. M. Hoffmann et al., “Linear measurements of nanomechanical phenomena using small-amplitude AFM,” Boston, MA, Amerika Birleşik Devletleri, 2004, vol. 838, Accessed: 00, 2021. [Online]. Available: https://www.scopus.com/inward/record.uri?partnerID=HzOxMe3b&scp=34249872470&origin=inward.