Quantitative electrostatic force measurement in AFM

Date

2000-04-02

Author

JEFFERY, Steve
Oral, Ahmet
Pethica, John B.

Metadata

Show full item record

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Item Usage Stats

142
views

0
downloads

We describe a method for measuring forces in the atomic force microscope (AFM), in which a small amplitude oscillation(similar to 1 Angstrom(p-p)) is applied to a stiff(similar to 40 N/m) cantilever below its first resonant frequency, and the force gradient is measured directly as a function of separation. We have used this instrument to measure electrostatic forces by applying an ac voltage between the tip and the sample, and observed a variation in contact potential difference with separation. We also show how the benefits of this instrument may be exploited to make meaningful capacitance measurements, especially at small tip-surface separations, and demonstrate the potential of this technique for quantitative dopant profiling in semiconductors.

Subject Keywords

Amplitude oscillation, Electrostatic force, AFM

URI

https://hdl.handle.net/11511/43089

Journal

Applied Surface Science

DOI

https://doi.org/10.1016/s0169-4332(99)00565-6

Collections

Department of Physics, Article

Suggestions

OpenMETU
Core

Free surface wave interaction with an oscillating cylinder Bozkaya, Canan (2014-01-01) The numerical solution of the special integral form of two-dimensional continuity and unsteady Navier Stokes equations is used to investigate vortex states of a horizontal cylinder undergoing forced oscillations in free surface water wave. This study aims to examine the consequence of degree of submergence of the cylinder beneath free surface at Froude number 0.4. Calculations are carried out for a single set of oscillation parameters at a Reynolds number of R = 200. Two new locked-on states of vortex forma...
Assessment and improvement of elementary force computations for cold forward rod extrusion Ocal, M; Egemen, N; Tekkaya, AE (2005-06-01) Two commonly used analytical force computation methods for cold forward rod extrusion are evaluated by means of precise finite element computations. The upperbound model by Avitzur based on the spherical velocity field and the model by Siebel based on a quasi-upper-bound solution are considered. It has been found that the pure deformation forces obtained by summing the ideal force and shear force terms deviate between +25% and -20% from the finite element solutions. Larger deviations, however, occur for the...
Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy Oral, Ahmet; ÖZER, HAKAN ÖZGÜR; HOFFMANN, PM; PETHICA, JB (2001-09-17) Quantitative force gradient images are obtained using a sub-angstrom amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the b...
Numerical Simulation of Reciprocating Flow Forced Convection in Two-Dimensional Channels Sert, Cüneyt (ASME International, 2003-5-20) <jats:p>Numerical simulations of laminar, forced convection heat transfer for reciprocating, two-dimensional channel flows are performed as a function of the penetration length, Womersley (α) and Prandtl (Pr) numbers. The numerical algorithm is based on a spectral element formulation, which enables high-order spatial resolution with exponential decay of discretization errors, and second-order time-accuracy. Uniform heat flux and constant temperature boundary conditions are imposed on certain regions of the ...
Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes Özer, H.Özgür; Atabak, Mehrdad; Ellialtǧlu, Recai M.; Oral, Ahmet (2002-03-28) Si(1 0 0)(2 x 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Angstrom oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction...

Citation Formats

S. JEFFERY, A. Oral, and J. B. Pethica, “Quantitative electrostatic force measurement in AFM,” Applied Surface Science, pp. 280–284, 2000, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/43089.