Scanning Hall probe microscopy of ferromagnetic structures

Date

1999-05-01

Author

Howells, GD
Oral, Ahmet
Bending, SJ
Andrews, SR
Squire, PT
Rice, P
de Lozanne, A
Bland, JAC
Kaya, I
Henini, M

Metadata

Show full item record

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Item Usage Stats

118
views

0
downloads

A state-of-the-art scanning Hall probe microscope (magnetic field sensitivity:spatial resolution: 30 nT/root Hz: 0.8 mu m-300 nT/root Hz : 0.25 mu m) has been used to image a range of ferromagnetic media. The technique is non-invasive and yields quantitative profiles of the stray fields near the sample surface as illustrated by images of a standard magnetic reference sample, permalloy nanostructures and colossal magnetoresistive perovskites. Rapid scanning (similar to 1 frame/12 sec) has also been used to study the domain reversal in a thin Ni him. (C) 1999 Published by Elsevier Science B.V. All rights reserved.

URI

https://hdl.handle.net/11511/94538

Journal

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS

DOI

https://doi.org/10.1016/s0304-8853(98)01002-6

Collections

Department of Physics, Article

Suggestions

OpenMETU
Core

Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback Dede, M.; Uerkmen, K.; Girisen, Oe.; Atabak, M.; Oral, Ahmet; Farrer, I.; Ritchie, D. (American Scientific Publishers, 2008-02-01) Scanning Hall Probe Microscopy (SHPM) is a quantitative and non-invasive technique for imaging localized surface magnetic field fluctuations such as ferromagnetic domains with high spatial and magnetic field resolution of similar to 50 nm and 7 mG/Hz(1/2) at room temperature. In the SHPM technique, scanning tunneling microscope (STM) or atomic force microscope (AFM) feedback is used to keep the Hall sensor in close proximity of the sample surface. However, STM tracking SHPM requires conductive samples; ther...
Scanning Hall probe microscopy of superconductors and magnetic materials Oral, Ahmet; Henini, M (1996-03-01) We describe results from a scanning Hall probe microscope operating in a broad temperature range, 4-300 K. A submicron Hall probe manufactured in a GaAs/AlGaAs two-dimensional electron gas is scanned over the sample to measure the surface magnetic fields using conventional scanning tunneling microscopy positioning techniques, The magnetic field structure of the sample together with the topography can be obtained simultaneously, The technique is noninvasive with an extremely low self-field of < 10(-2) G and ...
3D scanning Hall probe microscopy with 700 nm resolution DEDE, MUNIR; AKRAM, RİZWAN; Oral, Ahmet (2016-10-31) In this report, we present a three dimensional (3D) imaging of magnetic field vector (B) over right arrow (x,y,z) emanating from the magnetic material surfaces using a scanning Hall probe microscopy (3D-SHPM) down to a 700 nm spatial resolution. The Hall probe is used to measure B-z(x,y) on the specimen surface at different heights with the step size of Delta z = 250 nm, as we move away from the surface in z direction, until the field decays to zero. These set of images are then used to get partial derivati...
Optical anisotropy in GaSe Seyhan, A; Karabulut, O; Akınoğlu, Bülent Gültekin; Aslan, B; Turan, Raşit (Wiley, 2005-09-01) Optical anisotropy of the layer semiconductor GaSe has been studied by photoluminescence (PL) and Fourier Transform Infrared Spectroscopy (FTIR). The PL spectra are dominated by two closely positioned emission bands resulting from the free exciton and the bound exciton connected direct band edge of GaSe. Photoluminescence and transmission spectra of GaSe crystals have been measured for two cases in which the propagation vector k is perpendicular (k perpendicular to c) and parallel to the c-axis (k//c). Peak...
Thermal Sensitivity of the Fundamental Natural Frequency of a Resonant MEMS IR Detector Pixel Pala, Sedat; Azgın, Kıvanç (2017-08-10) This paper presents the effect of temperature on the natural frequency of (1,1) mode shape of a Resonant MEMS IR bolometer pixel in the range of 295-340 K. The detector pixel has a square plate geometry having side length of 1400 mu m and thickness of 35 mu m. The resonating plate is supported at its geometric center, enabling more robust pixels with fill factor greater than 90% and less complicated fabrication process. The sensor is fabricated using a Silicon-On-Glass (SOG) process. For the first time in t...

Citation Formats

G. Howells et al., “Scanning Hall probe microscopy of ferromagnetic structures,” JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, vol. 196, pp. 917–919, 1999, Accessed: 00, 2021. [Online]. Available: https://hdl.handle.net/11511/94538.