Scanning Hall probe microscopy of superconductors and magnetic materials

1996-03-01
Oral, Ahmet
Henini, M
We describe results from a scanning Hall probe microscope operating in a broad temperature range, 4-300 K. A submicron Hall probe manufactured in a GaAs/AlGaAs two-dimensional electron gas is scanned over the sample to measure the surface magnetic fields using conventional scanning tunneling microscopy positioning techniques, The magnetic field structure of the sample together with the topography can be obtained simultaneously, The technique is noninvasive with an extremely low self-field of < 10(-2) G and yields a quantitative measurement of the surface magnetic field in contrast to magnetic force microscopy. in addition the microscope has an outstanding magnetic field resolution (similar to 1.1 x 10(-3) G/Hz at 77 K) and high spatial resolution, similar to 0.85 mu m, Images of individual vortices in a high-T-c Y1Ba2Cu3O7-gamma thin film at low temperatures and magnetic domains in an Fe-garnet crystal at room temperature are presented. (C) 1996 American Vacuum Society.
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B

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A state-of-the-art scanning Hall probe microscope (magnetic field sensitivity:spatial resolution: 30 nT/root Hz: 0.8 mu m-300 nT/root Hz : 0.25 mu m) has been used to image a range of ferromagnetic media. The technique is non-invasive and yields quantitative profiles of the stray fields near the sample surface as illustrated by images of a standard magnetic reference sample, permalloy nanostructures and colossal magnetoresistive perovskites. Rapid scanning (similar to 1 frame/12 sec) has also been used to s...
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Scanning Hall Probe Microscopy (SHPM)[1] is a quantitative and non-invasive technique for imaging localized surface magnetic field fluctuations such as ferromagnetic domains with high spatial and magnetic field resolution of ∼50nm [2] and 7mG/√Hz at room temperature. In the SHPM technique, Scanning Tunneling Microscope (STM) [1] or Atomic Force Microscope (AFM)[3] feedback is used to keep the Hall sensor in close proximity of the sample. However, STM tracking SHPM requires conductive samples; therefore the ...
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Scanning Hall probe microscopy (SHPM) is a quantitative and noninvasive technique to image magnetic samples with high spatial and magnetic field resolution: ∼120 nm & 6×10-6T/√(Hz) at room temperature. A sub-micron Hall probe is scanned over the sample surface to measure the surface magnetic fields using conventional scanning tunneling microscopy-positioning techniques. We have developed new low noise, high performance InSb Hall sensors for room temperature scanning Hall probe microscopy (RT-SHPM), which ha...
Citation Formats
A. Oral and M. Henini, “Scanning Hall probe microscopy of superconductors and magnetic materials,” JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, vol. 14, no. 2, pp. 1202–1205, 1996, Accessed: 00, 2021. [Online]. Available: https://hdl.handle.net/11511/94424.