Show/Hide Menu
Hide/Show Apps
Logout
Türkçe
Türkçe
Search
Search
Login
Login
OpenMETU
OpenMETU
About
About
Open Science Policy
Open Science Policy
Open Access Guideline
Open Access Guideline
Postgraduate Thesis Guideline
Postgraduate Thesis Guideline
Communities & Collections
Communities & Collections
Help
Help
Frequently Asked Questions
Frequently Asked Questions
Guides
Guides
Thesis submission
Thesis submission
MS without thesis term project submission
MS without thesis term project submission
Publication submission with DOI
Publication submission with DOI
Publication submission
Publication submission
Supporting Information
Supporting Information
General Information
General Information
Copyright, Embargo and License
Copyright, Embargo and License
Contact us
Contact us
Sub-micron Direct Silicon Processing by Microsphere Focused Femtosecond Infrared Laser
Date
2021-01-01
Author
İdikut, Fırat
Karagöz, Burcu
Bek, Alpan
Metadata
Show full item record
This work is licensed under a
Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
.
Item Usage Stats
219
views
0
downloads
Cite This
URI
https://www.sensorsportal.com/HTML/BOOKSTORE/Advances_in_Optics_Vol_5.pdf
https://hdl.handle.net/11511/95364
Relation
Advances in Optics: Reviews Book Series, Volume 5
Collections
Department of Physics, Book / Book chapter
Suggestions
OpenMETU
Core
Sub-Continuum Air Conduction Measurement between Planar Structures
Ghashami, M; Bailey, J; Mitchel, E; Elçioğlu, Elif Begüm; Didari, Azadeh; Okutucu Özyurt, Hanife Tuba; Mengüç, Mustafa Pınar; Park, K (2018-12-07)
Sub-structure transfer matrix method for orthogonal planar frame analysis.
Acikel, Mustafa; Department of Civil Engineering (1973)
Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement
Atabak, Mehrdad; Unverdi, Ozhan; Özer, Hakan Özgür; Oral, Ahmet (2009-12-01)
We report the first results from novel sub-Angstrom oscillation amplitude non-contact atomic force microscopy developed for lateral force gradient measurements. Quantitative lateral force gradients between a tungsten tip and Si(1 1 1)-(7 x 7) surface can be measured using this microscope. Simultaneous lateral force gradient and scanning tunnelling microscope images of single and multi atomic steps are obtained. In our measurement, tunnel current is used as feedback. The lateral stiffness contrast has been o...
Super-gain parametric wave amplification in optical micro-resonators using ultrashort pump waves
Aşırım, Özüm Emre; Kuzuoğlu, Mustafa; Department of Electrical and Electronics Engineering (2020)
The aim of this thesis is to show that super-gain electromagnetic wave amplification can be achieved in a small micro-resonator using high-intensity ultrashort pump waves, provided that the frequencies of the ultrashort pulses are tuned to maximize the intracavity magnitude of the wave to be amplified, which is called the stimulus wave. In order to accomplish this, a dispersion analysis is performed via numerical modeling of the polarization density in terms of the nonlinear electron cloud motion. The polar...
Subgrid Stabilized Defect Correction Methods for the Navier–Stokes Equations
Kaya Merdan, Songül; Rivière, Béatrice (Society for Industrial & Applied Mathematics (SIAM), 2006-1)
We consider the synthesis of a recent subgrid stabilization method with defect correction methods. The combination is particularly efficient and combines the best algorithmic features of each. We prove convergence of the method for a fixed number of corrections as the mesh size goes to zero and derive parameter scalings from the analysis. We also present some numerical tests which both verify the theoretical predictions and illustrate the method's promise
Citation Formats
IEEE
ACM
APA
CHICAGO
MLA
BibTeX
F. İdikut, B. Karagöz, and A. Bek,
Sub-micron Direct Silicon Processing by Microsphere Focused Femtosecond Infrared Laser
. 2021.