Sub-micron Direct Silicon Processing by Microsphere Focused Femtosecond Infrared Laser



Sub-Continuum Air Conduction Measurement between Planar Structures
Ghashami, M; Bailey, J; Mitchel, E; Elçioğlu, Elif Begüm; Didari, Azadeh; Okutucu Özyurt, Hanife Tuba; Mengüç, Mustafa Pınar; Park, K (2018-12-07)
Sub-structure transfer matrix method for orthogonal planar frame analysis.
Acikel, Mustafa; Department of Civil Engineering (1973)
Sub-Angstrom oscillation amplitude non-contact atomic force microscopy for lateral force gradient measurement
Atabak, Mehrdad; Unverdi, Ozhan; Özer, Hakan Özgür; Oral, Ahmet (2009-12-01)
We report the first results from novel sub-Angstrom oscillation amplitude non-contact atomic force microscopy developed for lateral force gradient measurements. Quantitative lateral force gradients between a tungsten tip and Si(1 1 1)-(7 x 7) surface can be measured using this microscope. Simultaneous lateral force gradient and scanning tunnelling microscope images of single and multi atomic steps are obtained. In our measurement, tunnel current is used as feedback. The lateral stiffness contrast has been o...
Super-gain parametric wave amplification in optical micro-resonators using ultrashort pump waves
Aşırım, Özüm Emre; Kuzuoğlu, Mustafa; Department of Electrical and Electronics Engineering (2020)
The aim of this thesis is to show that super-gain electromagnetic wave amplification can be achieved in a small micro-resonator using high-intensity ultrashort pump waves, provided that the frequencies of the ultrashort pulses are tuned to maximize the intracavity magnitude of the wave to be amplified, which is called the stimulus wave. In order to accomplish this, a dispersion analysis is performed via numerical modeling of the polarization density in terms of the nonlinear electron cloud motion. The polar...
Subgrid Stabilized Defect Correction Methods for the Navier–Stokes Equations
Kaya Merdan, Songül; Rivière, Béatrice (Society for Industrial & Applied Mathematics (SIAM), 2006-1)
We consider the synthesis of a recent subgrid stabilization method with defect correction methods. The combination is particularly efficient and combines the best algorithmic features of each. We prove convergence of the method for a fixed number of corrections as the mesh size goes to zero and derive parameter scalings from the analysis. We also present some numerical tests which both verify the theoretical predictions and illustrate the method's promise
Citation Formats
F. İdikut, B. Karagöz, and A. Bek, Sub-micron Direct Silicon Processing by Microsphere Focused Femtosecond Infrared Laser. 2021.