Non-contact atomic force microscope in ultra high vacuum using radiation pressure excitation of cantilever with Fabry-Perot interferometer

Karagöz, Ercan
In this study Non-Contact Atomic Force Microscope (NC-AFM) imaging was performed by excitation of the cantilever via radiation pressure in a custom Ultra-High Vacuum (UHV) system. Both the excitation of the cantilever and the measurement of the deflection of the cantilever were done by employing a fiber Fabry-Pérot interferometer obtained by a TiO2 coating of the fiber end. This coating allows for a several times higher interference slope. The second normal mode of the cantilever oscillation, along with the first mode was clearly observed by excitation via radiation pressure without spurious peaks with Fabry-Pérot interferometer for the first time. By comparing the results of the cantilever spring constant measurements obtained by thermal excitation and radiation pressure excitation amplitude modulation, the reliability of the method of excitation by radiation pressure was shown. In order to test the interferometer a highly ordered pyrolytic graphite (HOPG) sample was imaged by exciting the cantilever with piezo-acoustic excitation. Then imaging experiments were carried out for obtaining atomic resolution image of a clean Si(111) (7x7) surface by exciting the cantilever with radiation pressure. 


Non-contact atomic force microscope (ncafm) operation in uhv using radiation pressure excitation of cantilever
Uysallı, Yiğit; Turan, Raşit; Yerci, Selçuk; Department of Physics (2016)
In this work a new method for excitation of Non-Contact Atomic Force Microscope (NCAFM) cantilevers by means of radiation pressure was developed and applied for NCAFM imaging for the first time in the world. Piezo excitation is the most common method of cantilever excitation in AFM devices. However, it has few drawbacks, sometimes spurious resonance peaks and non-ideal Lorentzian curves can be observed. Radiation pressure has earlier been used for calibration of AFM cantilevers but has never been used for i...
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Özer, H.Özgür; Atabak, Mehrdad; Ellialtǧlu, Recai M.; Oral, Ahmet (2002-03-28)
Si(1 0 0)(2 x 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Angstrom oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction...
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Akchurin, N; et. al. (1997-11-11)
We present the results of beam tests with high-energy (8-375 GeV) electrons, pions, protons and muons of a sampling calorimeter based on the detection of Cherenkov light produced by shower particles. The detector, a prototype for the very forward calorimeters in the CMS experiment, consists of thin quartz fibers embedded in a copper matrix. Results are given on the light yield of this device, on its energy resolution for electron and hadron detection, and on the signal uniformity and linearity. The signal g...
Frequency Selective Characteristics of a Plasma Layer with Sinusoidally Varying Electron Density Profile
GÜREL, ÇİĞDEM SEÇKİN; Oencue, Emrah (Springer Science and Business Media LLC, 2009-06-01)
In this study reflection, absorbtion and transmission characteristics of a plasma layer having sinusoidally varying electron number density are analysed. In the analysis, plasma layer is divided into thin subslabs with constant electron number densities. The general frequency selective behavior of the plasma is investigated by varying the plasma parameters, external magnetic field excitation and sinusoidal electron distribution in order to be used in recent plasma applications.
Radiation pressure excitation of a low temperature atomic force/magnetic force microscope for imaging in 4-300 K temperature range
Celik, Umit L; KARCI, Ozgur; UYSALLI, Yigit; Özer, Hakkı Tunçay; Oral, Ahmet (2017-01-01)
We describe a novel radiation pressure based cantilever excitation method for imaging in dynamic mode atomic force microscopy (AFM) for the first time. Piezo-excitation is the most common method for cantilever excitation, however it may cause spurious resonance peaks. Therefore, the direct excitation of the cantilever plays a crucial role in AFM imaging. A fiber optic interferometer with a 1310 nm laser was used both for the excitation of the cantilever at the resonance and the deflection measurement of the...
Citation Formats
E. Karagöz, “Non-contact atomic force microscope in ultra high vacuum using radiation pressure excitation of cantilever with Fabry-Perot interferometer,” M.S. - Master of Science, Middle East Technical University, 2017.