Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes

Date

2002-03-28

Author

Özer, H.Özgür
Atabak, Mehrdad
Ellialtǧlu, Recai M.
Oral, Ahmet

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Si(1 0 0)(2 x 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Angstrom oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction give atomic resolution in force gradient scans. This result suggests that short-range force interactions are responsible for atomic resolution in nc-AFM.

Subject Keywords

Non-Contact Atomic Force Microscopy, Small Oscillation Amplitudes, Si(100)(2 X 1), Force-Distance Spectroscopy, Short-Range Forces

URI

https://hdl.handle.net/11511/40784

Journal

Applied Surface Science

DOI

https://doi.org/10.1016/s0169-4332(01)00942-4

Collections

Department of Physics, Article

Citation Formats

H. Ö. Özer, M. Atabak, R. M. Ellialtǧlu, and A. Oral, “Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes,” Applied Surface Science, vol. 188, pp. 301–305, 2002, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/40784.