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Linewidth narrowing and Purcell enhancement in photonic crystal cavities on an Er-doped silicon nitride platform
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Date
2010-02-01
Author
Gong, Yiyang
Makarova, Maria
Yerci, Selcuk
Li, Rui
Stevens, Martin J.
BAEK, Burm
Yerci, Selçuk
Hadfield, Robert H.
Dorenbos, Sander N.
ZWİLLER, Val
Vuckovic, Jelena
Dal Negro, Luca
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Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
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Light emission at 1.54 mu m from an Er-doped amorphous silicon nitride layer coupled to photonic crystal resonators at cryogenic and room temperatures and under varying optical pump powers has been studied. The results demonstrate that small mode volume, high quality factor resonators enhance Er absorption and emission rates at the cavity resonance. Time resolved measurements give 11- to 17-fold Purcell enhancement of spontaneous emission at cryogenic temperatures, and 2.4-fold enhancement at room temperature. Resonances exhibit linewidth narrowing with pump power, signifying absorption bleaching and partial inversion of the Er ions cryogenic temperatures. We estimate that 31% of Er ions are excited at the highest pump power. (C) 2010 Optical Society of America
Subject Keywords
Photonic crystals
,
Resonators
,
Sources
,
Luminescence
,
Rare-earth doped materials
,
Spectroscopy
,
Photonic crystals
,
Resonators
,
Sources
,
Luminescence
,
Rare-earth doped materials
,
Spectroscopy
URI
https://hdl.handle.net/11511/30066
Journal
OPTICS EXPRESS
DOI
https://doi.org/10.1364/oe.18.002601
Collections
Graduate School of Natural and Applied Sciences, Article
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Linewidth narrowing and purcell enhancement in photonic crystal cavities on an Er-doped silicon nitride platform
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Light emission from Er-doped amorphous silicon nitride coupled to photonic crystal resonators is studied. The results demonstrate Purcell enhanced Er absorption and linewidth narrowing of the cavity resonance with increasing pump power.
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Y. Gong et al., “Linewidth narrowing and Purcell enhancement in photonic crystal cavities on an Er-doped silicon nitride platform,”
OPTICS EXPRESS
, pp. 2601–2612, 2010, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/30066.