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Integrated piezoresistive sensors for atomic force-guided scanning Hall probe microscopy

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2003-05-19
BROOK, ALEX J
BENDİNG, SJ
PINTO, JONATHAN
Oral, Ahmet
RİTCHİE, DAVİD
BEERE, H
HENİNİ, M
SPRİNGTHORPE, A
We report the development of an advanced sensor for atomic force-guided scanning Hall probe microscopy whereby both a high mobility heterostructure Hall effect magnetic sensor and an n-Al0.4Ga0.6As piezoresistive displacement sensor have been integrated in a single III-V semiconductor cantilever. This allows simple operation in high-vacuum/variable-temperature environments and enables very high magnetic and topographic resolution to be achieved simultaneously. Scans of magnetic induction and topography of a number of samples are presented to illustrate the sensor performance at 300 and 77 K. (C) 2003 American Institute of Physics.