Integrated piezoresistive sensors for atomic force-guided scanning Hall probe microscopy

Oral, Ahmet
We report the development of an advanced sensor for atomic force-guided scanning Hall probe microscopy whereby both a high mobility heterostructure Hall effect magnetic sensor and an n-Al0.4Ga0.6As piezoresistive displacement sensor have been integrated in a single III-V semiconductor cantilever. This allows simple operation in high-vacuum/variable-temperature environments and enables very high magnetic and topographic resolution to be achieved simultaneously. Scans of magnetic induction and topography of a number of samples are presented to illustrate the sensor performance at 300 and 77 K. (C) 2003 American Institute of Physics.


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Citation Formats
A. J. BROOK et al., “Integrated piezoresistive sensors for atomic force-guided scanning Hall probe microscopy,” APPLIED PHYSICS LETTERS, pp. 3538–3540, 2003, Accessed: 00, 2020. [Online]. Available: