Structural, optical and electrical properties of Al-doped ZnO microrods prepared by spray pyrolysis

Date

2010-05-31

Author

BACAKSIZ, EMİN
AKSU, Serdar
Yilmaz, Salih
Parlak, Mehmet
Altunbas, Mustafa

Metadata

Show full item record

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Item Usage Stats

144
views

0
downloads

Al-doped ZnO thin films were obtained on glass substrates by spray pyrolysis in air atmosphere. The molar ratio of Al in the spray solution was changed in the range of 0-20 at.% in steps of 5 at.%. X-ray diffraction patterns of the films showed that the undoped and Al-doped ZnO films exhibited hexagonal wurtzite crystal structure with a preferred orientation along (002) direction. Surface morphology of the films obtained by scanning electron microscopy revealed that pure ZnO film grew as quasi-aligned hexagonal shaped microrods with diameters varying between 0.7 and 1.3 mu m. However, Al doping resulted in pronounced changes in the morphology of the films such as the reduction in the rod diameter and deterioration in the surface quality of the rods. Nevertheless, the morphology of Al-doped samples still remained rod-like with a hexagonal cross-section. Flower-like structures in the films were observed due to rods slanting to each other when spray solution contained 20 at.% Al. Optical studies indicated that films had a low transmittance and the band gap decreased from 3.15 to 3.10 eV with the increasing Al molar ratio in the spray solution from 0 to 20 at.%.

Subject Keywords

Al-doped ZnO films, Spray pyrolysis, ZnO microrods, Electrical structural and optical properties

URI

https://hdl.handle.net/11511/39057

Journal

THIN SOLID FILMS

DOI

https://doi.org/10.1016/j.tsf.2009.10.141

Collections

Department of Physics, Article

Suggestions

OpenMETU
Core

Structural and optical properties of Zn-In-Te thin films deposited by thermal evaporation technique Gullu, H. H.; Bayrakli, O.; CANDAN, İDRİS; COŞKUN, EMRE; Parlak, Mehmet (2013-07-25) Annealing effects on structural and optical properties of the thermally evaporated Zn-In-Te(ZIT) thin films have been investigated. The structural and the compositional analyses were carried out by means of X-ray diffraction (XRD) and energy dispersive X-ray analysis (EDXA). The as-grown and annealed ZIT films had polycrystalline structure and the preferred orientation changed from (220) to (112) direction with increasing annealing temperature. The optical properties and constants were determined by transmi...
Structural and optoelectronic properties of vanadium pentoxide thin films deposited by ultrasonic spray pyrolysis. Koç, Şeyma; Ünalan, Hüsnü Emrah; Department of Metallurgical and Materials Engineering (2019) Nanocrystalline vanadium pentoxide (V2O5) thin films were deposited onto fluorine doped tin oxide (FTO) coated glass substrates using ultrasonic spray pyrolysis and spin coating methods. The formation behavior of thin films, the effects of different production methods on the characteristics of the films and their microstructural / physical properties were investigated as a function of annealing temperature in the range of 450-550 °C and other controllable process parameters. Structural, morphological and op...
Structural and optical properties of thermally evaporated Ga-In-Se thin films IŞIK, MEHMET; Güllü, Hasan Hüseyin (2014-05-30) In this paper, structural and optical properties of Ga-In-Se (GIS) thin films deposited by thermal evaporation technique have been investigated. The effect of annealing was also studied for samples annealed at temperatures between 300 degrees C and 500 degrees C. X-ray diffraction, energy dispersive X-ray analysis and scanning electron microscopy have been used for structural characterization. It was reported that increase of annealing temperature results with better crystallization and chemical composition...
Structural, optical and magnetic properties of Zn1-xCoxO thin films prepared by spray pyrolysis BACAKSIZ, EMİN; AKSU, SERHAT; Basol, B. M.; Altunbas, M.; Parlak, Mehmet; Yamnaz, E. (Elsevier BV, 2008-09-01) A series of Co-doped ZnO films were fabricated by a spray pyrolysis method. The X-ray diffraction patterns of the films showed that the undoped and Co-doped ZnO films exhibit wurtzite crystal structure. Surface morphology of the films obtained by scanning electron microscopy reveals that pure ZnO film has the hexagonal shaped microrods. The introduction of Co content in the structure did not affect the surface morphology of the films significantly. Magnetic hysteresis loops were observed at room temperature...
Structural and optical characteristics of thermally evaporated TlGaSe2 thin films Isik, M.; KARATAY, AHMET; Hasanlı, Nızamı (2022-02-01) The present paper reports the structural and optical properties of thermally evaporated TlGaSe2 thin films. X-ray diffraction pattern of evaporated film presented two diffraction peaks around 24.15 and 36.00° which are associated with planes of monoclinic unit cell. Surface morphology of the TlGaSe2 thin films was investigated by scanning electron and atomic force microscopy techniques. Although there was observed some ignorable amount of clusters of quasi-spherical shape in the scanning electron microscope...

Citation Formats

E. BACAKSIZ, S. AKSU, S. Yilmaz, M. Parlak, and M. Altunbas, “Structural, optical and electrical properties of Al-doped ZnO microrods prepared by spray pyrolysis,” THIN SOLID FILMS, pp. 4076–4080, 2010, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/39057.