Structural and optical properties of Zn-In-Te thin films deposited by thermal evaporation technique

2013-07-25
Gullu, H. H.
Bayrakli, O.
CANDAN, İDRİS
COŞKUN, EMRE
Parlak, Mehmet
Annealing effects on structural and optical properties of the thermally evaporated Zn-In-Te(ZIT) thin films have been investigated. The structural and the compositional analyses were carried out by means of X-ray diffraction (XRD) and energy dispersive X-ray analysis (EDXA). The as-grown and annealed ZIT films had polycrystalline structure and the preferred orientation changed from (220) to (112) direction with increasing annealing temperature. The optical properties and constants were determined by transmittance measurements in the wavelength range of 200-2000 nm. The effect of annealing on the optical parameters was determined by using Single Oscillator Model (SOM), Envelope Model (EM) and Cauchy Method. The absorbance studies revealed that the films had three distinct transitions in the high absorption region because of the tetragonal distortion, and that was used to evaluate the splitting energies of crystal-field and spin-orbit splitting. The fundamental optical band gap values were found to be lying in the range of 1.51 and 1.72 eV and the notable change of the band gaps due to annealing temperatures was observed. Finally, the Urbach energies were calculated and it was observed that the band tail energies were increasing with increasing annealing temperature. (C) 2013 Elsevier B. V. All rights reserved.
JOURNAL OF ALLOYS AND COMPOUNDS

Suggestions

Structural and optical properties of thermally evaporated Ga-In-Se thin films
IŞIK, MEHMET; Güllü, Hasan Hüseyin (2014-05-30)
In this paper, structural and optical properties of Ga-In-Se (GIS) thin films deposited by thermal evaporation technique have been investigated. The effect of annealing was also studied for samples annealed at temperatures between 300 degrees C and 500 degrees C. X-ray diffraction, energy dispersive X-ray analysis and scanning electron microscopy have been used for structural characterization. It was reported that increase of annealing temperature results with better crystallization and chemical composition...
Structural and optical characteristics of thermally evaporated TlGaSe2 thin films
Isik, M.; KARATAY, AHMET; Hasanlı, Nızamı (2022-02-01)
The present paper reports the structural and optical properties of thermally evaporated TlGaSe2 thin films. X-ray diffraction pattern of evaporated film presented two diffraction peaks around 24.15 and 36.00° which are associated with planes of monoclinic unit cell. Surface morphology of the TlGaSe2 thin films was investigated by scanning electron and atomic force microscopy techniques. Although there was observed some ignorable amount of clusters of quasi-spherical shape in the scanning electron microscope...
Investigation of structural and optical parameters of Cu-Ag-In-Se thin films deposited by thermal evaporation method
Gullu, H. H.; CANDAN, İDRİS; COŞKUN, EMRE; Parlak, Mehmet (2015-01-01)
Annealing effect on the structural and optical properties of the quaternary Cu-Ag-In-Se thin film deposited by the thermal evaporation has been investigated. The evaporation source was prepared by using vertical Bridgman-Stockbarger crystal growth system. Structural analysis indicated that annealing the films following to the deposition resulted in the changes from amorphous to polycrystalline phase with the preferred orientation along (1 1 2) direction. In order to determine the optical properties of the t...
Structural, optical and electrical characterization of CDSEXTE1-X thin films
Demir, Merve; Parlak, Mehmet; Department of Physics (2020)
The aim of this study is to investigate the structural, optical and electrical properties of ternary CdSexTe1-x thin films. CdTe and CdSe thin films are being used in solar cells due to their favorable direct band gaps of 1.5eV and 1.7eV, respectively. Moreover, having high absorption coefficients provide an important role to CdTe and CdSe films as an absorber layer. Therefore, by mixing these two films, properties of resultant ternary CdSexTe1-x alloy can be optimized for solar cell applications. Chemical ...
Structural and optical properties of thermally evaporated Cu-Ga-S (CGS) thin films
Gullu, H. H.; IŞIK, MEHMET; Hasanlı, Nızamı (2018-10-15)
The structural and optical properties of thermally evaporated Cu-Ga-S (CGS) thin films were investigated by Xray diffraction (XRD), energy dispersive X-ray spectroscopy (EDS), atomic force microscopy (AFM) and optical transmittance measurements. The effect of annealing temperature on the results of applied techniques was also studied in the present paper. EDS results revealed that each of the elements, Cu, Ga and S are presented in the films and Cu and Ga concentration increases whereas S concentration decr...
Citation Formats
H. H. Gullu, O. Bayrakli, İ. CANDAN, E. COŞKUN, and M. Parlak, “Structural and optical properties of Zn-In-Te thin films deposited by thermal evaporation technique,” JOURNAL OF ALLOYS AND COMPOUNDS, pp. 83–89, 2013, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/32789.