The investigation of structural, electrical, and optical properties of thermal evaporated AgGaS2 thin films

Date

2011-01-31

Author

KARAAĞAÇ, HAKAN
Parlak, Mehmet

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AgGaS2 (AGS) thin films were deposited onto glass substrates by sequential thermal evaporation of AgGaS2 single crystalline powder and excess silver (Ag) interlayer. Systematic optimization to obtain single phase AgGaS2 thin films was carried out by changing the thickness of the excess silver layer. The structure and composition of as-grown and annealed films were studied by means of X-ray diffraction and energy dispersive X-ray analysis, respectively. The optical properties of AGS thin films determined by transmittance and reflection measurements showed that they had quite high absorption coefficient with the values around 10(4) (cm(-1)). The calculated band gap values were found to be between 2.30 and 2.75 eV depending on annealing temperature. The refractive index (n) and extinction coefficient (k) of the films were determined by the envelope method. Finally, photo-electrical measurements under different illumination intensities were carried out, and different sensitizing and recombination centers were defined.

Subject Keywords

Materials Chemistry, Electronic, Optical and Magnetic Materials, Surfaces, Coatings and Films, Surfaces and Interfaces, Metals and Alloys

URI

https://hdl.handle.net/11511/39487

Journal

THIN SOLID FILMS

DOI

https://doi.org/10.1016/j.tsf.2010.10.027

Collections

Department of Physics, Article

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Citation Formats

H. KARAAĞAÇ and M. Parlak, “The investigation of structural, electrical, and optical properties of thermal evaporated AgGaS2 thin films,” THIN SOLID FILMS, pp. 2055–2061, 2011, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/39487.