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Temperature dependence of the first-order Raman scattering in GaS layered crystals
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Date
2000-01-01
Author
Hasanlı, Nızamı
Ozkan, H
Kocabas, C
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The temperature dependence (15-293 K) of the six Raman-active mode frequencies and linewidths in gallium sulfide has been measured in the frequency range from 15 to 380 cm(-1). We observed softening and broadening of the optical phonon lines with increasing temperature. Comparison between the experimental data and theories of the shift and broadening of the interlayer and intralayer phonon lines during the heating of the crystal showed that the experimental dependencies can be explained by the contributions from thermal expansion and lattice anharmonicity. The pure-temperature contribution (phonon-phonon coupling) is due to three- and four-phonon processes.
Subject Keywords
Semiconductors
,
Optical properties
,
Inelastic light scattering
URI
https://hdl.handle.net/11511/40005
Journal
SOLID STATE COMMUNICATIONS
DOI
https://doi.org/10.1016/s0038-1098(00)00292-1
Collections
Department of Physics, Article
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Temperature dependence of the first-order Raman scattering in GaS layered crystal (vol 116, pg 147, 2000)
Hasanlı, Nızamı; Ozkan, H; Kocabas, C (2001-01-01)
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N. Hasanlı, H. Ozkan, and C. Kocabas, “Temperature dependence of the first-order Raman scattering in GaS layered crystals,”
SOLID STATE COMMUNICATIONS
, pp. 147–151, 2000, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/40005.