Analysis of surface structures using XPS with external stimuli

Download

index.pdf

Date

2006-01-01

Author

Ertaş, Gülay

Metadata

Show full item record

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Item Usage Stats

127
views

0
downloads

X-ray Photoelectron Spectroscopy, XPS, due to the perfect match of its probe length (1-10 nm) to nanoparticle size, chemical specificity, and susceptibility to electrical charges, is ideally suited for harvesting chemical, physical and electrical information from nanosized surface structures. In addition, by recording XPS spectra while applying external d.c. and/or pulsed voltage stimuli, it is also possible to control the extent of charging and extract various analytical information. In the simplest form, application of a static (d.c.) voltage stimuli enhances separation of otherwise overlapping peaks of gold nanoparticles from that of metallic gold. When the voltage stimuli is applied in the form of rectangular pulses, dynamic information is obtained from the frequency dependence of the charging shifts. This enables us to better probe the composition of nanoparticles produced (i.e. silicide formation, or whether or the extent of reduction, etc.) when platinum salt is deposited on silicon substrates. Finally, by recording the data in different time windows, XPS spectra can be recorded ill time-resolved fashion. Time-resolved spectra can be used to detect, locate and quantify the charges developed in various surface structures like gold(core)/silica(shell) nanoparticles oil a copper substrate.

Subject Keywords

XPS, Differential Charging, Peak Separation, Time-Resolved XPS

URI

https://hdl.handle.net/11511/40604

DOI

https://doi.org/10.1007/1-4020-4741-x_5

Collections

Department of Chemistry, Conference / Seminar

Suggestions

OpenMETU
Core

Study of W boson production in pPb collisions at root(NN)-N-S=5.02 TeV Adam, W.; et. al. (Elsevier BV, 2015-11-01) The first study of W boson production in pPb collisions is presented, for bosons decaying to a muon or electron, and a neutrino. The measurements are based on a data sample corresponding to an integrated luminosity of 34.6 nb(-1) at a nucleon-nucleon centre-of-mass energy of root(NN)-N-S = 5.02 TeV, collected by the CMS experiment. The W boson differential cross sections, lepton charge asymmetry, and forward-backward asymmetries are measured for leptons of transverse momentum exceeding 25 GeV/c, and as a fu...
XPS characterization of Bi and Mn collected on atom-trapping silica for AAS Suzer, S; Ertas, N; Ataman, Osman Yavuz (1999-04-01) The chemical state of analyte species collected on a water-cooled silica tube during atom-trapping atomic absorption spectrometric determination is investigated with the use of X-ray photoelectron spectroscopy (XPS) for Bi and Mn. Analysis of the Bi 4f(7/2) peak reveals that the chemical state of Bi is +3 during initial trapping (before the atomization stage), but an additional 0-valence state of Bi is also observed after the atomization stage. With the use of the measured Mn 2p(3/2) binding energy together...
Enhancement of H-2 Storage in Carbon Nanotubes via Doping with a Boron Nitride Ring Onay, Aytun Koyuncular; Erkoç, Şakir (American Scientific Publishers, 2009-04-01) Hydrogen storage capacity of carbon nanotubes with different chirality have been investigated by performing quantum chemical methods at semiempirical and DFT levels of calculations. It has been found that boron nitrite substitutional doping increases the hydrogen storage capacity of carbon nanotubes.
Depth profile investigations of silicon nanocrystals formed in sapphire by ion implantation Yerci, Selçuk; Yıldız, İlker; BAROZZİ, MARİO; BERSANİ, MASSİMO; Turan, Raşit (2007-07-15) Depth profiles of Si nanocrystals formed in sapphire by ion implantation and the effect of charging during X-ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrometry (SIMS) measurements have been studied. Atomic concentration and the chemical environment of Si, Al, and O have been measured as a function of depth from the sample surface by SIMS and XPS. Both as-implanted and annealed samples have been analyzed to understand the effect of nanocrystal formation on the depth distribution, chemic...
Measurement of the triple-differential dijet cross section in proton-proton collisions at root s=8 TeV and constraints on parton distribution functions Sirunyan, A. M.; et. al. (Springer Science and Business Media LLC, 2017-11-01) A measurement is presented of the triple-differential dijet cross section at a centre-of-mass energy of 8 TeV using 19.7 fb(-1) of data collected with the CMS detector in proton-proton collisions at the LHC. The cross section is measured as a function of the average transverse momentum, half the rapidity separation, and the boost of the two leading jets in the event. The cross section is corrected for detector effects and compared to calculations in perturbative quantum chromodynamics at next-to-leading ord...

Citation Formats

G. Ertaş, “Analysis of surface structures using XPS with external stimuli,” 2006, vol. 228, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/40604.