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Electron-phonon scattering in metallic single-walled carbon nanotubes

Park, JY
Rosenblatt, S
Yaish, Y
Sazonova, V
Toffoli, Hande
Braig, S
Arias, TA
Brouwer, PW
McEuen, PL
Electron scattering rates in metallic single-walled carbon nanotubes are studied using an atomic force microscope as an electrical probe. From the scaling of the resistance of the same nanotube with length in the low- and high-bias regimes, the mean-free paths for both regimes are inferred. The observed scattering rates are consistent with calculations for acoustic-phonon scattering at low biases and zone boundary/optical phonon scattering at high biases.