Show/Hide Menu
Hide/Show Apps
Logout
Türkçe
Türkçe
Search
Search
Login
Login
OpenMETU
OpenMETU
About
About
Open Science Policy
Open Science Policy
Open Access Guideline
Open Access Guideline
Postgraduate Thesis Guideline
Postgraduate Thesis Guideline
Communities & Collections
Communities & Collections
Help
Help
Frequently Asked Questions
Frequently Asked Questions
Guides
Guides
Thesis submission
Thesis submission
MS without thesis term project submission
MS without thesis term project submission
Publication submission with DOI
Publication submission with DOI
Publication submission
Publication submission
Supporting Information
Supporting Information
General Information
General Information
Copyright, Embargo and License
Copyright, Embargo and License
Contact us
Contact us
Influence of thermal annealing on microstructural, morphological, optical properties and surface electronic structure of copper oxide thin films
Date
2014-10-15
Author
AKSOY, FUNDA
AKGÜL, GÜVENÇ
Yıldırım, Nuray
Ünalan, Hüsnü Emrah
Turan, Raşit
Metadata
Show full item record
This work is licensed under a
Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
.
Item Usage Stats
355
views
0
downloads
Cite This
In this study, effect of the post-deposition thermal annealing on copper oxide thin films has been systemically investigated. The copper oxide thin films were chemically deposited on glass substrates by spin-coating. Samples were annealed in air at atmospheric pressure and at different temperatures ranging from 200 to 600 degrees C. The microstructural, morphological, optical properties and surface electronic structure of the thin films have been studied by diagnostic techniques such as X-ray diffraction (XRD), Raman spectroscopy, ultraviolet-visible (UV-VIS) absorption spectroscopy, field emission scanning electron microscopy (FESEM), atomic force microscopy (AFM), and X-ray photoelectron spectroscopy (XPS). The thickness of the films was about 520 nm. Crystallinity and grain size was found to improve with annealing temperature. The optical bandgap of the samples was found to be in between 1.93 and 2.08 eV. Cupric oxide (Cuo), cuprous oxide (Cu2O) and copper hydroxide (Cu(OH)(2)) phases were observed on the surface of as-deposited and 600 degrees C annealed thin films and relative concentrations of these three phases were found to depend on annealing temperature. A complete characterization reported herein allowed us to better understand the surface properties of copper oxide thin films which could then be used as active layers in optoelectronic devices such as solar cells and photodetectors.
Subject Keywords
General Materials Science
,
Condensed Matter Physics
URI
https://hdl.handle.net/11511/42698
Journal
MATERIALS CHEMISTRY AND PHYSICS
DOI
https://doi.org/10.1016/j.matchemphys.2014.06.047
Collections
Continuing Education Center (SEM), Article
Suggestions
OpenMETU
Core
Influence of photonic excitations on the electrical parameters of TlInS2 crystals
QASRAWI, ATEF FAYEZ HASAN; Hasanlı, Nızamı (Wiley, 2010-04-01)
The photo-excitation effect on the current transport mechanism in TlInS2 crystals has been studied by means of dark and illuminated conductivity measurements. The temperature-dependent electrical conductivity analysis in the temperature region of 110-340 K revealed the domination of the thermionic emission and the thermally assisted variable range hopping (VRH) of charge carriers above and below 160 K, respectively. Above 160 K, the conductivity activation energies in the dark are found to be 0.28 and 0.15 ...
Effects of annealing on structural, electrical and optical properties of AgGa(Se0.5S0.5)(2) thin films deposited by using sintered stoichometric powder
KARAAĞAÇ, HAKAN; Parlak, Mehmet (Wiley, 2009-04-01)
The structural, electrical and optical properties of AgGa(Se0.5S0.5)(2) thin films deposited by using the thermal evaporation method have been investigated as a function of annealing in the temperature range of 450-600 degrees C. X-ray diffraction (X-RD) analysis showed that the structural transformation from amorphous to polycrystalline structure started at 450 degrees C with mixed binary phases of Ga2Se3, Ga2S3, ternary phase of AgGaS2 and single phase of S. The compositional analysis with the energy disp...
Effect of fiber and resin types on mechanical properties of fiber-reinforced composite pipe
Gokce, Neslihan; Yılmazer, Ülkü; SUBAŞI, SERKAN (Thomas Telford Ltd., 2019-09-01)
The aim of this study was to evaluate the effects of the types of fiber and resin on the mechanical properties of polyester composite pipes. Orthophthalic, isophthalic and vinyl ester resins were used as the matrix; E-glass, electrical/chemical resistance (ECR)-glass and basalt fibers were used as reinforcement; and 98% silica (SiO2) sand was used as filler in mixtures. Samples were produced by the centrifugal casting method. Samples cut from the produced pipes were tested to determine stiffness and longitu...
Effect of temperature and isomorphic atom substitution on optical absorption edge of TlInS2xSe2(1-x) mixed crystals (0.25 <= x <= 1)
Hasanlı, Nızamı (Wiley, 2010-05-01)
The optical properties of the TlInS2xSe2(1-x) mixed crystals (0.25 <= x <= 1) have been investigated through the transmission and reflection measurements in the wavelength range of 400-1100 nm. The optical indirect band gap energies were determined by means of the analysis of the absorption data. It was found that the energy band gaps decrease with the increase of selenium atoms content in the TlInS2xSe2(1-x) mixed crystals. The transmission measurements carried out in the temperature range of 10-300 K reve...
Effects of CdCl2 treatment on properties of CdTe thin films grown by evaporation at low substrate temperatures
BACAKSIZ, EMİN; ALTUNBAŞ, MUSTAFA; Yflniaz, S.; Tornakin, M.; Parlak, Mehmet (Wiley, 2007-09-01)
The structural, morphological and optical properties of vacuum-evaporated CdTe thin films were investigated as a function of substrate temperature and post-deposition annealing without and with CdCl2/treatment at 400 degrees C for 30 min. Diffraction patterns are almost the same exhibiting higher preferential orientation corresponding to (111) plane of the cubic phase. The intensity of the (111) peak increased with the CdCl2/annealing treatment. The microstructure observed for all films following the CdCl2/...
Citation Formats
IEEE
ACM
APA
CHICAGO
MLA
BibTeX
F. AKSOY, G. AKGÜL, N. Yıldırım, H. E. Ünalan, and R. Turan, “Influence of thermal annealing on microstructural, morphological, optical properties and surface electronic structure of copper oxide thin films,”
MATERIALS CHEMISTRY AND PHYSICS
, pp. 987–995, 2014, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/42698.