Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution

Download

index.pdf

Date

2014-10-01

Author

Karci, Ozgur
DEDE, Munir
Oral, Ahmet

Metadata

Show full item record

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Item Usage Stats

101
views

0
downloads

We describe the design of a wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with a self-aligned fibre-cantilever mechanism. An alignment chip with alignment groves and a special mechanical design are used to eliminate tedious and time consuming fibre-cantilever alignment procedure for the entire temperature range. A low noise, Michelson fibre interferometer was integrated into the system for measuring deflection of the cantilever. The spectral noise density of the system was measured to be similar to 12 fm/root Hz at 4.2 K at 3 mW incident optical power. Abrikosov vortices in BSCCO(2212) single crystal sample and a high density hard disk sample were imaged at 10 nm resolution to demonstrate the performance of the system. (C) 2014 AIP Publishing LLC.

Subject Keywords

Vortices, Cantilevers, Interferometer

URI

https://hdl.handle.net/11511/42936

Journal

REVIEW OF SCIENTIFIC INSTRUMENTS

DOI

https://doi.org/10.1063/1.4897147

Collections

Department of Physics, Article

Suggestions

OpenMETU
Core

Radiation pressure excitation of a low temperature atomic force/magnetic force microscope for imaging in 4-300 K temperature range Celik, Umit L; KARCI, Ozgur; UYSALLI, Yigit; Özer, Hakkı Tunçay; Oral, Ahmet (2017-01-01) We describe a novel radiation pressure based cantilever excitation method for imaging in dynamic mode atomic force microscopy (AFM) for the first time. Piezo-excitation is the most common method for cantilever excitation, however it may cause spurious resonance peaks. Therefore, the direct excitation of the cantilever plays a crucial role in AFM imaging. A fiber optic interferometer with a 1310 nm laser was used both for the excitation of the cantilever at the resonance and the deflection measurement of the...
Development of mems technology based microwave and millimeter-wave components Çetintepe, Çağrı; Demir, Şimşek; Department of Electrical and Electronics Engineering (2010) This thesis presents development of microwave lumped elements for a specific surface-micromachining based technology, a self-contained mechanical characterization of fixed-fixed type beams and realization of a shunt, capacitive-contact RF MEMS switch for millimeter-wave applications. Interdigital capacitor, planar spiral inductor and microstrip patch lumped elements developed in this thesis are tailored for a surface-micromachining technology incorporating a single metallization layer, which allows an easy ...
Performance evaluation of magnetic flux density based magnetic resonance electrical impedance tomography reconstruction algorithms Eker, Gökhan; Eyüboğlu, Behçet Murat; Department of Electrical and Electronics Engineering (2009) Magnetic Resonance Electrical Impedance Tomography (MREIT) reconstructs images of electrical conductivity distribution based on magnetic flux density (B) measurements. Magnetic flux density is generated by an externally applied current on the object and measured by a Magnetic Resonance Imaging (MRI) scanner. With the measured data and peripheral voltage measurements, the conductivity distribution of the object can be reconstructed. There are two types of reconstruction algorithms. First type uses current de...
Development of atomic force microscopy system and kelvin probe microscopy system for use in semiconductor nanocrystal characterization Bostancı, Umut; Turan, Raşit; Department of Physics (2007) Atomic Force Microscopy (AFM) and Kelvin Probe Microscopy (KPM) are two surface characterization methods suitable for semiconductor nanocrystal applications. In this thesis work, an AFM system with KPM capability was developed and implemented. It was observed that, the effect of electrostatic interaction of the probe cantilever with the sample can be significantly reduced by using higher order resonant modes for Kelvin force detection. Germanium nanocrystals were grown on silicon substrate using different g...
Analysis of reconstruction performance of magnetic resonance conductivity tensor imaging (MRCTI) using simulated measurements DEĞİRMENCİ, EVREN; Eyüboğlu, Behçet Murat (2017-01-01) Magnetic resonance conductivity tensor imaging (MRCTI) was proposed recently to produce electrical conductivity images of anisotropic tissues. Similar to magnetic resonance electrical impedance tomography (MREIT), MRCTI uses magnetic field and boundary potential measurements obtained utilizing magnetic resonance imaging techniques. MRCTI reconstructs tensor images of anisotropic conductivity whereas MREIT reconstructs isotropic conductivity images. In this study, spatial resolution and linearity of five rec...

Citation Formats

O. Karci, M. DEDE, and A. Oral, “Design of a self-aligned, wide temperature range (300 mK-300 K) atomic force microscope/magnetic force microscope with 10 nm magnetic force microscope resolution,” REVIEW OF SCIENTIFIC INSTRUMENTS, pp. 0–0, 2014, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/42936.