Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

Download

index.pdf

Date

2001-09-17

Author

Oral, Ahmet
ÖZER, HAKAN ÖZGÜR
HOFFMANN, PM
PETHICA, JB

Metadata

Show full item record

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.

Item Usage Stats

198
views

0
downloads

Quantitative force gradient images are obtained using a sub-angstrom amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the background longer-range interaction, whose relative magnitude depends on the tip structure, has a significant effect on the contrast observed at the atomic scale. (C) 2001 American Institute of Physics.

Subject Keywords

Atomic force microscopy, Scanning tunneling microscopy, Reactive surfaces, Tip

URI

https://hdl.handle.net/11511/39340

Journal

APPLIED PHYSICS LETTERS

DOI

https://doi.org/10.1063/1.1389785

Collections

Department of Physics, Article

Suggestions

OpenMETU
Core

Real-time scanning hall probe microscopy Oral, Ahmet; HENİNİ, M (1996-08-26) We describe a low-noise scanning Hall probe microscope having unprecedented magnetic field sensitivity (similar to 2.9x10(-8) T/root Hz at 77 K), high spatial resolution, (similar to 0.85 mu m),nd operating in real-time (similar to 1 frame/s) for studying flux profiles at surfaces. A submicron Hall probe manufactured in a GaAs/A1GaAs two-dimensional electron gas (2DEG) is scanned over the sample to measure the surface magnetic fields using conventional scanning tunneling microscopy positioning techniques. F...
Simultaneous non-contact atomic force microscopy (nc-AFM)/STM imaging and force spectroscopy of Si(1 0 0)(2 × 1) with small oscillation amplitudes Özer, H.Özgür; Atabak, Mehrdad; Ellialtǧlu, Recai M.; Oral, Ahmet (2002-03-28) Si(1 0 0)(2 x 1) surface is imaged using a new non-contact atomic force microscopy (nc-AFM)/STM with sub-Angstrom oscillation amplitudes using stiff tungsten levers. Simultaneous force gradient and STM images of individual dimers and atomic scale defects are obtained. We measured force-distance (f-d) curves with different tips. Some of the tips show long force interactions, whereas some others resolve short-range interatomic force interactions. We observed that the tips showing short-range force interaction...
Time-resolved microscopy of femtosecond laser filaments in fused quartz Kadan, Viktor; Blonskyi, Ivan; Pavlov, Ihor (2022-02-01) Detailed picture of continuous shape evolution of femtosecond laser pulse has been recorded directly in the process of filament formation in fused silica using time-resolved polarization microscopy with similar to 70 fs temporal resolution. The main stages of the pulse transformation (temporal self-compression and splitting, formation of conical wave) have been studied. The maximum temporal compression has been found to be achieved by the leading subpulse after the time splitting event. It was found that th...
Microscopic measurement of penetration depth in YBa2Cu3O7-delta thin films by scanning Hall probe microscopy Oral, Ahmet; HUMPHREYS, RG; HENİNİ, M (1997-01-01) We have used a low noise scanning Hall probe microscope to measure the penetration depth microscopically in a YBa2Cu3O7-delta thin film as a function of temperature. The instrument has high magnetic field (approximate to 2.9 x 10(-8) T HZ(-1/2) at 77 K) and spatial resolution ( approximate to 0.85 mu m). Magnetic field profiles of single vortices in the superconducting film have been successfully measured and the microscopic penetration depth of the superconductor has been extracted. We find surprisingly la...
Quantitative electrostatic force measurement in AFM JEFFERY, Steve; Oral, Ahmet; Pethica, John B. (2000-04-02) We describe a method for measuring forces in the atomic force microscope (AFM), in which a small amplitude oscillation(similar to 1 Angstrom(p-p)) is applied to a stiff(similar to 40 N/m) cantilever below its first resonant frequency, and the force gradient is measured directly as a function of separation. We have used this instrument to measure electrostatic forces by applying an ac voltage between the tip and the sample, and observed a variation in contact potential difference with separation. We also sho...

Citation Formats

A. Oral, H. Ö. ÖZER, P. HOFFMANN, and J. PETHICA, “Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy,” APPLIED PHYSICS LETTERS, pp. 1915–1917, 2001, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/39340.