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Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy
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Date
2001-09-17
Author
Oral, Ahmet
ÖZER, HAKAN ÖZGÜR
HOFFMANN, PM
PETHICA, JB
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Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
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Quantitative force gradient images are obtained using a sub-angstrom amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the background longer-range interaction, whose relative magnitude depends on the tip structure, has a significant effect on the contrast observed at the atomic scale. (C) 2001 American Institute of Physics.
Subject Keywords
Atomic force microscopy
,
Scanning tunneling microscopy
,
Reactive surfaces
,
Tip
URI
https://hdl.handle.net/11511/39340
Journal
APPLIED PHYSICS LETTERS
DOI
https://doi.org/10.1063/1.1389785
Collections
Department of Physics, Article
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A. Oral, H. Ö. ÖZER, P. HOFFMANN, and J. PETHICA, “Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy,”
APPLIED PHYSICS LETTERS
, pp. 1915–1917, 2001, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/39340.