Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy

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2001-09-17

Author

Oral, Ahmet
ÖZER, HAKAN ÖZGÜR
HOFFMANN, PM
PETHICA, JB

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Quantitative force gradient images are obtained using a sub-angstrom amplitude, off-resonance lever oscillation method during scanning tunneling microscopy imaging. We report the direct observation of short-range bonds, and the measured short-range force interaction agrees well in magnitude and length scale with theoretical predictions for single bonds. Atomic resolution is shown to be associated with the presence of a prominent short-range contribution to the total force interaction. It is shown that the background longer-range interaction, whose relative magnitude depends on the tip structure, has a significant effect on the contrast observed at the atomic scale. (C) 2001 American Institute of Physics.

Subject Keywords

Atomic force microscopy, Scanning tunneling microscopy, Reactive surfaces, Tip

URI

https://hdl.handle.net/11511/39340

Journal

APPLIED PHYSICS LETTERS

DOI

https://doi.org/10.1063/1.1389785

Collections

Department of Physics, Article

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Citation Formats

A. Oral, H. Ö. ÖZER, P. HOFFMANN, and J. PETHICA, “Quantitative atom-resolved force gradient imaging using noncontact atomic force microscopy,” APPLIED PHYSICS LETTERS, pp. 1915–1917, 2001, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/39340.