Low-field AC susceptibility in Pr1-xHoxMn2Ge2

Date

2007-01-01

Author

Kilic, A.
Kervan, N.
Kervan, S.
Gencer, Ayşenur
Ozkan, H.

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We report the structure and magnetic properties of Pr1-xHoxMn2Ge2 (0.0 <= x <= 1.0) germanides by means of X-ray diffraction (XRD), differential scanning calorimetry (DSC) techniques and AC magnetic susceptibility measurements. All compounds crystallize in the ThCr2Si2-type structure with the space group I 4/mmm. Substitution of Ho for Pr leads to a linear decrease in the lattice constants and the unit cell volume. The samples with x = 0 and x = 0.8 have spin reorientation temperature. The results are collected in a phase diagram.

Subject Keywords

Materials Chemistry, General Chemistry, Condensed Matter Physics

URI

https://hdl.handle.net/11511/57114

Journal

SOLID STATE COMMUNICATIONS

DOI

https://doi.org/10.1016/j.ssc.2006.10.016

Collections

Department of Physics, Article

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Citation Formats

A. Kilic, N. Kervan, S. Kervan, A. Gencer, and H. Ozkan, “Low-field AC susceptibility in Pr1-xHoxMn2Ge2,” SOLID STATE COMMUNICATIONS, pp. 223–227, 2007, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/57114.