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Low-field AC susceptibility in Pr1-xHoxMn2Ge2
Date
2007-01-01
Author
Kilic, A.
Kervan, N.
Kervan, S.
Gencer, Ayşenur
Ozkan, H.
Metadata
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We report the structure and magnetic properties of Pr1-xHoxMn2Ge2 (0.0 <= x <= 1.0) germanides by means of X-ray diffraction (XRD), differential scanning calorimetry (DSC) techniques and AC magnetic susceptibility measurements. All compounds crystallize in the ThCr2Si2-type structure with the space group I 4/mmm. Substitution of Ho for Pr leads to a linear decrease in the lattice constants and the unit cell volume. The samples with x = 0 and x = 0.8 have spin reorientation temperature. The results are collected in a phase diagram.
Subject Keywords
Materials Chemistry
,
General Chemistry
,
Condensed Matter Physics
URI
https://hdl.handle.net/11511/57114
Journal
SOLID STATE COMMUNICATIONS
DOI
https://doi.org/10.1016/j.ssc.2006.10.016
Collections
Department of Physics, Article
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A. Kilic, N. Kervan, S. Kervan, A. Gencer, and H. Ozkan, “Low-field AC susceptibility in Pr1-xHoxMn2Ge2,”
SOLID STATE COMMUNICATIONS
, pp. 223–227, 2007, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/57114.