A PRACTICAL AND CONVENIENT METHOD FOR THE MEASUREMENT OF FOCAL SPOTS OF INDUSTRIAL X-RAY TUBES

1991-06-01
Doyum, Ahmet Bülent
NABEL, E
In order to produce radiographs with controlled image quality, among other factors, it is important to know and to be able to monitor any changes in the actual size of the radiation source. This article describes a simple and practical method for the determination of source sizes which can be conveniently applied in any radiographic testing shop or even in the field. The use of a microdensitometer often needed for focal spot size measurements is avoided.
NDT & E INTERNATIONAL

Suggestions

Analysis of the standard deviation of surface potential fluctuations in MOS interface from DLTS spectra
Ozder, S; Atilgan, I; Katircioglu, B (IOP Publishing, 1998-05-01)
The surface potential fluctuations can have significant effects on both the magnitude and shape of the measured small-pulse DLTS spectrum. An increase in the dispersion parameter sigma(S) of the surface potential distribution, which is assumed to have a Gaussian form, leads to a reduction in the DLTS signal size, a shift of the peak position and a broadening of the peak shape. A computer program including the exponential temperature dependence of hole capture cross section, sigma(P) = sigma(0) exp(-Delta E-...
Reflectance spectra and refractive index of a Nd : YAG laser-oxidized Si surface
Aygun, G; Atanassova, E; Turan, Raşit; Babeva, T (Elsevier BV, 2005-02-15)
The reflectance spectra and refractive index of Nd:YAG laser-oxidized SiO2 layers with thicknesses from 15 to 75 nm have been investigated with respect to the laser beam energy density and substrate temperature. Thickness and refractive index of films have been determined from reflectance measurements at normal light incidence in the spectral range 300-800 nm. It was found that the oxide-growth conditions at higher substrate temperatures and laser powers greater than 3.36 J cm(-2) provides a better film qua...
Optical characteristics of Bi12SiO20 single crystals by spectroscopic ellipsometry
Isik, M.; Delice, S.; Nasser, H.; Hasanlı, Nızamı; Darvishov, N. H.; Bagiev, V. E. (Elsevier BV, 2020-12-01)
Structural and optical characteristics of Bi12SiO20 single crystal grown by the Czochralski method were investigated by virtue of X-ray diffraction (XRD) and spectroscopic ellipsometry measurements. XRD analysis indicated that the studied crystal possesses cubic structure with lattice parameters of a = 1.0107 nm. Spectral dependencies of several optical parameters like complex dielectric constant, refractive index, extinction and absorption coefficients were determined using ellipsometry experiments perform...
Modeling and verification of a missile launcher system
Isik, C.; Ider, S. K.; Acar, B. (SAGE Publications, 2014-03-01)
The launcher models used in most of the previous studies have few degrees of freedom that cannot possibly capture many important motion characteristics. In this work, a flexible multibody model of a missile launcher system is built. The fixed, azimuth and elevation platforms and the launching pod are modeled as flexible bodies. Both the normal vibration modes and constraint modes are considered. Modes that do not contribute significantly to the total strain energy are eliminated to reduce simulation time. T...
Mixed conduction and anisotropic single oscillator parameters in low dimensional TlInSe2 crystals
QASRAWI, ATEF FAYEZ HASAN; Hasanlı, Nızamı (Elsevier BV, 2013-08-15)
Due to the importance of the TlInSe2 crystal as neutron and gamma-ray detectors, its electrical and dispersive optical parameters have been investigated. Particularly, the anisotropic current conduction mechanism in the temperature region of 100-350 K and the room temperature anisotropic dispersive optical properties were studied by means of electrical conductivity and optical reflectance, respectively. It has been shown that the mixed conduction is the most dominant transport mechanism in the TlInSe2 cryst...
Citation Formats
A. B. Doyum and E. NABEL, “A PRACTICAL AND CONVENIENT METHOD FOR THE MEASUREMENT OF FOCAL SPOTS OF INDUSTRIAL X-RAY TUBES,” NDT & E INTERNATIONAL, pp. 145–149, 1991, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/57301.