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Escape of photoelectrons and Compton-scattered photons from an HPGe detector
Date
2003-07-01
Author
Can, Cüneyt
Metadata
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The response function of a planar HPGe detector due to escape of photoelectrons and Compton-scattered photons was studied for a point source with 59.5 keV energy. It was shown that both mechanisms, in addition to Ge x-ray escape, leading to partial deposition of energy, could be observed in the same experiment. A Monte Carlo program was used to investigate these components of the response function. The results indicate that although the escape of scattered photons and Ge x-rays are of the same magnitude, the escape of photoelectrons plays a more important role in the efficiency of a detector. Copyright (C) 2003 John Wiley Sons, Ltd.
Subject Keywords
Spectroscopy
URI
https://hdl.handle.net/11511/63197
Journal
X-RAY SPECTROMETRY
DOI
https://doi.org/10.1002/xrs.650
Collections
Department of Physics, Article
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C. Can, “Escape of photoelectrons and Compton-scattered photons from an HPGe detector,”
X-RAY SPECTROMETRY
, pp. 280–284, 2003, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/63197.