Photoelectron, compton and characteristic x-ray escape from an HPGe detector in the range 8-52 keV

2004-11-01
Yilmaz, E
Can, Cüneyt
Escape of photoelectrons, Compton-scattered photons and Ge x-rays from an HPGe detector was studied as a function of energy in the range 8-52 keV. A variable-energy source producing Cu, Rb, Mo, Ag, Ba. and Tb x-rays was used. All three mechanisms for energy loss were observed in the same experiment for Ba and Tb, while only x-ray and photoelectron escapes were evident in the spectra for Ag, Mo, Rb, and Cu. Spectral features and possible mechanisms for partial energy deposition were investigated. A Monte Carlo program was used to simulate the relevant interactions, and to estimate the escape probabilities. Copyright (C) 2004 John Wiley Sons, Ltd.
X-RAY SPECTROMETRY

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Citation Formats
E. Yilmaz and C. Can, “Photoelectron, compton and characteristic x-ray escape from an HPGe detector in the range 8-52 keV,” X-RAY SPECTROMETRY, pp. 439–446, 2004, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/63229.