Escape of photons and electrons from an HPGe detector at 81 keV

Date

2006-01-01

Author

Yilmaz, E
Pekoz, R
Can, Cüneyt

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Escape of Ge K x-rays, Compton-scattered incident radiation and photoelectrons from an HPGe detector was investigated for 81 keV incident photons. All three escape mechanisms were observed in the same experiment. Experimental escape fractions were compared with the results from Monte Carlo simulations. Good agreement was obtained for the escape of photons. However, the simulations underestimated the escape of photoelectrons. Copyright (c) 2005 John Wiley & Sons, Ltd.

Subject Keywords

Spectroscopy

URI

https://hdl.handle.net/11511/63286

Journal

X-RAY SPECTROMETRY

DOI

https://doi.org/10.1002/xrs.813

Collections

Department of Physics, Article

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Citation Formats

E. Yilmaz, R. Pekoz, and C. Can, “Escape of photons and electrons from an HPGe detector at 81 keV,” X-RAY SPECTROMETRY, pp. 42–46, 2006, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/63286.