Show/Hide Menu
Hide/Show Apps
Logout
Türkçe
Türkçe
Search
Search
Login
Login
OpenMETU
OpenMETU
About
About
Open Science Policy
Open Science Policy
Open Access Guideline
Open Access Guideline
Postgraduate Thesis Guideline
Postgraduate Thesis Guideline
Communities & Collections
Communities & Collections
Help
Help
Frequently Asked Questions
Frequently Asked Questions
Guides
Guides
Thesis submission
Thesis submission
MS without thesis term project submission
MS without thesis term project submission
Publication submission with DOI
Publication submission with DOI
Publication submission
Publication submission
Supporting Information
Supporting Information
General Information
General Information
Copyright, Embargo and License
Copyright, Embargo and License
Contact us
Contact us
Characterization of chiral metamaterial sensor with high sensitivity
Date
2020-02-01
Author
Dalgac, Sekip
BAKIR, MEHMET
KARADAĞ, FARUK
ÜNAL, EMİN
KARAASLAN, MUHARREM
Sabah, Cumali
Metadata
Show full item record
This work is licensed under a
Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License
.
Item Usage Stats
199
views
0
downloads
Cite This
In this study, a chiral metamaterial sensor applications are created by placing asymmetrically two meander line front and back side of the substrate layer. Characterization of the dielectric constant, thickness and loss tangent have been performed both in simulation and experimental methods. Different Arlon type materials used for showing the effects of dielectric constant on transmission coefficient. Obtained bandwidths for characterization are greater than the similar studies which verifyies increased sensitivity. This study also differs from similar studies by presenting permeability and loss tangent effects on transmission coefficient as well as having wider bandwidth that increase sensitivity due to its special chiral design. Set of experimental study performed to verify simulated ones for change in thickness, dielectric constant and loss tangent and compatible results with simulated ones obtained. According to simulation and experimental study results, proposed structurecan be used myriad microwave sensing applications effectively due to high sensitivity property.
Subject Keywords
Electrical and Electronic Engineering
,
Atomic and Molecular Physics, and Optics
,
Electronic, Optical and Magnetic Materials
URI
https://hdl.handle.net/11511/68325
Journal
OPTIK
DOI
https://doi.org/10.1016/j.ijleo.2019.163673
Collections
Engineering, Article
Suggestions
OpenMETU
Core
Characterization of GZO thin films fabricated by RF magnetron sputtering method and electrical properties of In/GZO/Si/Al diode
Surucu, O. Bayrakli (Springer Science and Business Media LLC, 2019-11-01)
The main focus of this work is the structural and optical characterization of Ga-doped ZnO (GZO) thin film and determination of the device behavior of In/GZO/Si/Al diode. GZO thin films were deposited by RF magnetron sputtering technique from single target. The structural and morphological properties of GZO film were investigated by X-ray diffraction (XRD), Raman scattering, scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy analysis (EDS) measurements. Optical properties of the fil...
Design of metasurface polarization converter from linearly polarized signal to circularly polarized signal
AKGÖL, OĞUZHAN; ÜNAL, EMİN; ALTINTAŞ, OLCAY; KARAASLAN, MUHARREM; KARADAĞ, FARUK; Sabah, Cumali (Elsevier BV, 2018-01-01)
In this study, we both numerically and experimentally present a metasurface (MS) polarization converter to transform linearly polarized signal into circularly polarized one. The unit cell consists of two rectangular metallic patches placed at the crossed corners of rectangularly arranged inclusions. The results of a full-wave Electromagnetic (EM) simulator are compared to those of free space measurement using two horn antenna at microwave frequency regime. For a linearly polarized antenna, the s-parameters ...
Investigation of electrical characteristics of Ag/ZnO/Si sandwich structure
Gullu, H. H.; Surucu, O. Bayrakli; Terlemezoğlu, Makbule; Yildiz, D. E.; Parlak, Mehmet (Springer Science and Business Media LLC, 2019-08-01)
In this study, temperature-dependent current-voltage (I-V), frequency-dependent capacitance-voltage (C-V) and conductance-voltage (G/omega-V) measurements are carried out for the electrical characterization of a zinc oxide (ZnO) thin film-based diode. The sandwich structure in the form of Ag/ZnO/Si/Al is investigated at temperatures between 220 and 360 K and in the frequency region of 1 kHz-1 MHz. ZnO thin film layer is deposited on a p-Si wafer substrate as a transparent conductive oxide layer by taking in...
Full-wave analysis of microstrip lines on a highly lossy substrate
Prakash, VVS; Kuzuoğlu, Mustafa; Mittra, R (Wiley, 2003-06-05)
The finite-element method has been used for analyzing open microstrip line structures on highly lossy substrates. The geometry descritization has been carried out by using quadrilateral elements, and the spurious solutions art avoided by employing tangential vector formulation. The difficulties associated with finding the propagation constant of a highly lossy structure 13.1, solving a generalized eigenvalue problem are discussed. A methodology is presented,for a fast and efficient computation of the attenu...
Calculation of the soft-mode frequency for the alpha - beta transition in quartz
Yurtseven, Hasan Hamit (Elsevier BV, 2016-01-01)
The alpha - beta structural transition occurs in quartz at T-c = 846 K. The frequency of the soft mode associated with the volume increase, decreases with increasing temperature as the transition temperature is approached.
Citation Formats
IEEE
ACM
APA
CHICAGO
MLA
BibTeX
S. Dalgac, M. BAKIR, F. KARADAĞ, E. ÜNAL, M. KARAASLAN, and C. Sabah, “Characterization of chiral metamaterial sensor with high sensitivity,”
OPTIK
, pp. 0–0, 2020, Accessed: 00, 2020. [Online]. Available: https://hdl.handle.net/11511/68325.